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电流作用下孤立磁斯格明子形变的实空间测定

Real-space determination of the isolated magnetic skyrmion deformation under electric current flow.

作者信息

Yasin Fehmi Sami, Masell Jan, Karube Kosuke, Kikkawa Akiko, Taguchi Yasujiro, Tokura Yoshinori, Yu Xiuzhen

机构信息

RIKEN Center for Emergent Matter Science (CEMS), Wako, 351-0198, Japan.

Institute of Theoretical Solid State Physics, Karlsruhe Institute of Technology (KIT), Karlsruhe, 76049, Germany.

出版信息

Proc Natl Acad Sci U S A. 2022 Oct 11;119(41):e2200958119. doi: 10.1073/pnas.2200958119. Epub 2022 Oct 3.

Abstract

The manipulation and control of electron spins, the fundamental building blocks of magnetic domains and spin textures, are at the core of spintronics. Of particular interest is the effect of the electric current on topological magnetic skyrmions, such as the current-induced deformation of isolated skyrmions. The deformation has consequences ranging from perturbed dynamics to modified packing configurations. In this study, we measured the current-driven real-space deformation of isolated, pinned skyrmions within CoZn at room temperature. We observed that the skyrmions are surprisingly soft, readily deforming during electric current application into an elliptical shape with a well-defined deformation axis (semimajor axis). We found that this axis rotates unidirectionally toward the current direction irrespective of electric current polarity and that the elliptical deformation reverses back upon current termination. We quantified the average distortion δ, which increased by ∼90% during the largest applied current density || = 8.46 ×10 A/m when compared with the skyrmion's intrinsic shape ([Formula: see text]). Additionally, we demonstrated an approximately 120% average skyrmion core size expansion during current application, highlighting the skyrmions' inherent topological protection. This evaluation of in situ electric current-induced skyrmion deformation paints a clearer picture of spin-polarized electron-skyrmion interactions and may prove essential in designing spintronic devices.

摘要

电子自旋作为磁畴和自旋纹理的基本组成部分,其操控与控制是自旋电子学的核心。特别令人感兴趣的是电流对拓扑磁斯格明子的影响,例如电流诱导的孤立斯格明子的形变。这种形变会产生从动力学扰动到堆积构型改变等一系列后果。在本研究中,我们在室温下测量了CoZn中孤立的、被钉扎的斯格明子的电流驱动实空间形变。我们观察到,斯格明子出奇地柔软,在施加电流时很容易形变为具有明确形变轴(长半轴)的椭圆形。我们发现,无论电流极性如何,该轴都单向地朝着电流方向旋转,并且在电流终止时椭圆形形变会反转回去。我们对平均畸变δ进行了量化,与斯格明子的固有形状([公式:见正文])相比,在施加的最大电流密度|| = 8.46×10 A/m时,δ增加了约90%。此外,我们还证明了在施加电流期间斯格明子核心尺寸平均膨胀约120%,突出了斯格明子固有的拓扑保护特性。这种对原位电流诱导的斯格明子形变的评估更清晰地描绘了自旋极化电子 - 斯格明子相互作用的情况,并且在设计自旋电子器件中可能至关重要。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2971/9564101/e73a9be308aa/pnas.2200958119fig01.jpg

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