Yang Ting, Jiang Hongyi, Dong Ye, Liu Shuning, Gao Shuai
Opt Express. 2022 Oct 10;30(21):38239-38255. doi: 10.1364/OE.464393.
Oxygen vacancies (V), acting as electron traps, have a significant impact on the persistent luminescence (PersL) property of persistent phosphors. However, the effect of V on PersL remains still unclear enough to limit the development of PersL materials. In this study, the V concentration of the YCeYbAlGaO phosphor is accurately controlled by annealing in air and 10%H/90%Ar atmospheres at various temperatures. The results show as the annealing temperature increases during the air annealing the V concentration, the PersL durations, and the thermoluminescence (TL) intensity constantly decreases, and the three data coincide well with each other, indicating the PersL property of the YCeYbAlGaO is successfully tuned. Besides, the trap structure of the YCeYbAlGaO and the charge compensation effect of Yb ions on V defects are also discussed. By deconvoluting the TL curves, the Yb trap with a depth of 0.58 eV has been distinctly separated from the V traps with a quasi-continuous and broad distribution of depths ranging from 0.58 to 1.21 eV. Our work demonstrates a better understanding of the relationship between V and PersL is of great significance to design a high-performance phosphor.
氧空位(V)作为电子陷阱,对长余辉荧光粉的长余辉(PersL)性能有显著影响。然而,V对PersL的影响仍不够清晰,限制了长余辉材料的发展。在本研究中,通过在不同温度的空气和10%H/90%Ar气氛中退火,精确控制了YCeYbAlGaO荧光粉的V浓度。结果表明,在空气退火过程中,随着退火温度升高,V浓度、PersL持续时间和热释光(TL)强度不断降低,且这三个数据相互吻合良好,表明YCeYbAlGaO的PersL性能得到成功调控。此外,还讨论了YCeYbAlGaO的陷阱结构以及Yb离子对V缺陷的电荷补偿效应。通过对TL曲线进行去卷积,深度为0.58 eV的Yb陷阱已与深度在0.58至1.21 eV范围内呈准连续且分布较宽的V陷阱明显区分开来。我们的工作表明,更好地理解V与PersL之间的关系对于设计高性能荧光粉具有重要意义。