Dat Vo D, Vu Tuan V, Lavrentyev A A, Khyzhun O Y, Hieu Nguyen N, Tong Hien D
Laboratory for Computational Physics, Institute for Computational Science and Artificial Intelligence, Van Lang University Ho Chi Minh City Vietnam
Faculty of Mechanical - Electrical and Computer Engineering, Van Lang University Ho Chi Minh City Vietnam.
RSC Adv. 2022 Oct 12;12(45):29113-29123. doi: 10.1039/d2ra05265b. eCollection 2022 Oct 11.
The MXene SnSiGeN monolayer as a new member of the MoSiN family was proposed for the first time, and its structural and electronic properties were explored by applying first-principles calculations with both PBE and hybrid HSE06 approaches. The layered hexagonal honeycomb structure of SnSiGeN was determined to be stable under dynamical effects or at room temperature of 300 K, with a rather high cohesive energy of 7.0 eV. The layered SnSiGeN has a Young's modulus of 365.699 N m and a Poisson's ratio of 0.295. The HSE06 approach predicted an indirect band gap of around 2.4 eV for the layered SnSiGeN. While the major donation from the N-p orbitals to the band structure makes SnSiGeN's band gap close to those of similar 2D MXenes, the smaller distributions from the other orbitals of Sn, Si, and Ge slightly vary this band gap. The work functions of the GeN and SiN surfaces are 6.367 eV and 5.903 eV, respectively. The band gap of the layered SnSiGeN can be easily tuned by strain and an external electric field. A semiconductor-metal transition can occur at certain values of strain, and with an electric field higher than 5 V nm. The electron mobility of the layered SnSiGeN can reach up to 677.4 cm V s, which is much higher than the hole mobility of about 52 cm V s. The mentioned characteristics make the layered SnSiGeN a very promising material for use in electronic and photoelectronic devices, and for solar energy conversion.
首次提出了MXene SnSiGeN单层作为MoSiN家族的新成员,并通过采用PBE和混合HSE06方法的第一性原理计算来探索其结构和电子性质。确定SnSiGeN的层状六角蜂窝结构在动力学效应下或在300 K的室温下是稳定的,具有相当高的7.0 eV内聚能。层状SnSiGeN的杨氏模量为365.699 N/m,泊松比为0.295。HSE06方法预测层状SnSiGeN的间接带隙约为2.4 eV。虽然N-p轨道对能带结构的主要贡献使SnSiGeN的带隙接近类似二维MXene的带隙,但Sn、Si和Ge的其他轨道的较小分布使该带隙略有变化。GeN和SiN表面的功函数分别为6.367 eV和5.903 eV。层状SnSiGeN的带隙可以通过应变和外部电场轻松调节。在一定的应变值下以及电场高于5 V/nm时会发生半导体-金属转变。层状SnSiGeN的电子迁移率可达677.4 cm² V⁻¹ s⁻¹,远高于约52 cm² V⁻¹ s⁻¹的空穴迁移率。上述特性使层状SnSiGeN成为用于电子和光电器件以及太阳能转换的非常有前途的材料。