Garnier Marie, Lesniewska Eric, Optasanu Virgil, Guelorget Bruno, Berger Pascal, Lavisse Luc, François Manuel, Custovic Irma, Pocholle Nicolas, Bourillot Eric
Laboratory Interdisciplinaire Carnot de Bourgogne (ICB), UMR 6303 CNRS, University of Bourgogne, 21000 Dijon, France.
Laboratory of Mechanical & Material Engineering (UR LASMIS), University of Technology Troyes, 10300 Troyes, France.
Nanomaterials (Basel). 2024 Apr 3;14(7):628. doi: 10.3390/nano14070628.
Conventional techniques that measure the concentration of light elements in metallic materials lack high-resolution performance due to their intrinsic limitation of sensitivity. In that context, scanning microwave microscopy has the potential to significantly enhance the quantification of element distribution due to its ability to perform a tomographic investigation of the sample. Scanning microwave microscopy associates the local electromagnetic measurement and the nanoscale resolution of an atomic force microscope. This technique allows the simultaneous characterization of oxygen concentration as well as local mechanical properties by microwave phase shift and amplitude signal, respectively. The technique was calibrated by comparison with nuclear reaction analysis and nanoindentation measurement. We demonstrated the reliability of the scanning microwave technique by studying thin oxygen-enriched layers on a Ti-6Al-4V alloy. This innovative approach opens novel possibilities for the indirect quantification of light chemical element diffusion in metallic materials. This technique is applicable to the control and optimization of industrial processes.
传统的测量金属材料中轻元素浓度的技术由于其固有的灵敏度限制而缺乏高分辨率性能。在这种情况下，扫描微波显微镜有潜力显著提高元素分布的量化，因为它能够对样品进行断层扫描研究。扫描微波显微镜将局部电磁测量与原子力显微镜的纳米级分辨率相结合。该技术分别通过微波相移和幅度信号，能够同时表征氧浓度以及局部机械性能。通过与核反应分析和纳米压痕测量进行比较，对该技术进行了校准。我们通过研究Ti-6Al-4V合金上的富氧薄层，证明了扫描微波技术的可靠性。这种创新方法为间接量化金属材料中轻化学元素的扩散开辟了新的可能性。该技术适用于工业过程的控制和优化。
