Department of Electronics and System Engineering, University of Cadiz, 11519, Puerto Real, Spain.
Sci Rep. 2023 Jan 7;13(1):385. doi: 10.1038/s41598-022-27327-z.
Occurrence level comparison of catastrophic failures due to radiation effects on electronic components or collision with space debris are studied in two types of satellites: cubesats and microsats. Low Earth Orbit (LEO) case studies are proposed, and the level of catastrophic failure occurrence is quantified for the same mission duration. The variation in the occurrence of failures is studied and there is a determination of which is more likely. Emphasis is placed on examining how an increase in space debris would affect the reliability of future space missions.
研究了两种类型的卫星（立方星和微卫星）中因电子元件辐射效应或与空间碎片碰撞而导致灾难性故障的发生水平。提出了近地轨道（LEO）案例研究，并在相同的任务持续时间内量化了灾难性故障发生的水平。研究了故障发生的变化，并确定了哪种情况更有可能发生。重点研究了空间碎片的增加将如何影响未来太空任务的可靠性。
