Nakazawa Katsuaki, Mitsuishi Kazutaka
International Center for Young Scientists (ICYS), National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan.
Research Center for Advanced Measurement and Characterization, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan.
Microscopy (Oxf). 2023 Oct 9;72(5):446-449. doi: 10.1093/jmicro/dfad006.
Diffraction patterns contain useful information about the materials. Recent developments in four-dimensional scanning transmission electron microscopy and the acquisition of the spatial distribution of diffraction patterns have produced significant results. The acquisition of a temporal series of diffractions is achieved for a stationary beam. However, the acquisition of spatiotemporal distribution of diffraction patterns has only been established under limited conditions. In this study, we developed a simple method that enables the recording of the spatiotemporal distribution of diffraction patterns and applied it to the relaxation time measurement that is robust to sample drift.
衍射图案包含有关材料的有用信息。四维扫描透射电子显微镜的最新进展以及衍射图案空间分布的获取已产生了显著成果。对于固定光束可实现一系列衍射的时间序列采集。然而，衍射图案的时空分布采集仅在有限条件下得以实现。在本研究中，我们开发了一种简单方法，能够记录衍射图案的时空分布，并将其应用于对样品漂移具有鲁棒性的弛豫时间测量。
