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用于PVT法8英寸碳化硅晶体生长的热场设计与优化

Design and Optimization of Thermal Field for PVT Method 8-Inch SiC Crystal Growth.

作者信息

Zhang Shengtao, Fu Guoqing, Cai Hongda, Yang Junzhi, Fan Guofeng, Chen Yanyu, Li Tie, Zhao Lili

机构信息

Harbin Institute of Technology, School of Chemistry and Chemical Engineering, Harbin 150001, China.

Harbin KY Semiconductor, Inc., Harbin 150028, China.

出版信息

Materials (Basel). 2023 Jan 12;16(2):767. doi: 10.3390/ma16020767.

Abstract

As a wide bandgap semiconductor material, silicon carbide has promising prospects for application. However, its commercial production size is currently 6 inches, and the difficulty in preparing larger single crystals increases exponentially with size increasing. Large-size single crystal growth is faced with the enormous problem of radial growth conditions deteriorating. Based on simulation tools, the physical field of 8-inch crystal growth is modeled and studied. By introducing the design of the seed cavity, the radial temperature difference in the seed crystal surface is reduced by 88% from 93 K of a basic scheme to 11 K, and the thermal field conditions with uniform radial temperature and moderate temperature gradient are obtained. Meanwhile, the effects of different processing conditions and relative positions of key structures on the surface temperature and axial temperature gradients of the seed crystals are analyzed in terms of new thermal field design, including induction power, frequency, diameter and height of coils, the distance between raw materials and the seed crystal. Meanwhiles, better process conditions and relative positions under experimental conditions are obtained. Based on the optimized conditions, the thermal field verification under seedless conditions is carried out, discovering that the single crystal deposition rate is 90% of that of polycrystalline deposition under the experimental conditions. Meanwhile, an 8-inch polycrystalline with 9.6 mm uniform deposition was successfully obtained after 120 h crystal growth, whose convexity is reduced from 13 mm to 6.4 mm compared with the original scheme. The results indicate that the optimized conditions can be used for single-crystal growth.

摘要

作为一种宽带隙半导体材料,碳化硅具有广阔的应用前景。然而,其目前的商业生产尺寸为6英寸,制备更大尺寸的单晶难度会随着尺寸的增加呈指数级上升。大尺寸单晶生长面临着径向生长条件恶化这一巨大问题。基于模拟工具,对8英寸晶体生长的物理场进行了建模和研究。通过引入籽晶腔设计,籽晶表面的径向温差从基本方案的93K降低了88%,降至11K,从而获得了径向温度均匀且温度梯度适中的热场条件。同时,从新的热场设计角度分析了不同工艺条件以及关键结构的相对位置对籽晶表面温度和轴向温度梯度的影响,包括感应功率、频率、线圈直径和高度、原料与籽晶之间的距离等。同时,获得了实验条件下更好的工艺条件和相对位置。基于优化后的条件,进行了无籽条件下的热场验证,发现在实验条件下单晶沉积速率是多晶沉积速率的90%。同时,经过120小时的晶体生长,成功获得了一个沉积均匀度为9.6毫米的8英寸多晶,与原方案相比,其凸度从13毫米降低到了6.4毫米。结果表明,优化后的条件可用于单晶生长。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e59f/9867089/8a34c59b6467/materials-16-00767-g001.jpg

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