Li Jiayang, Poon Andrew W
Photonic Device Laboratory, Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Clear Water Bay, Hong Kong.
Micromachines (Basel). 2023 Feb 6;14(2):399. doi: 10.3390/mi14020399.
Various crystalline silicon carbide (SiC) polytypes are emerging as promising photonic materials due to their wide bandgap energies and nonlinear optical properties. However, their wafer forms cannot readily provide a refractive index contrast for optical confinement in the SiC layer, which makes it difficult to realize a SiC-based integrated photonic platform. In this paper, we demonstrate a 3C-SiC-on-insulator (3C-SiCoI)-based integrated photonic platform by transferring the epitaxial 3C-SiC layer from a silicon die to a borosilicate glass substrate using anodic bonding. By fine-tuning the fabrication process, we demonstrated nearly 100% area transferring die-to-wafer bonding. We fabricated waveguide-coupled microring resonators using sulfur hexafluoride (SF)-based dry etching and demonstrated a moderate loaded quality (Q) factor of 1.4 × 10. We experimentally excluded the existence of the photorefractive effect in this platform at sub-milliwatt on-chip input optical power levels. This 3C-SiCoI platform is promising for applications, including large-scale integration of linear, nonlinear and quantum photonics.
由于其宽带隙能量和非线性光学特性,各种晶体碳化硅(SiC)多型体正成为有前景的光子材料。然而,它们的晶圆形式无法轻易为SiC层中的光限制提供折射率对比度,这使得实现基于SiC的集成光子平台变得困难。在本文中,我们通过使用阳极键合将外延3C-SiC层从硅芯片转移到硼硅酸盐玻璃衬底上,展示了一种基于绝缘体上3C-SiC(3C-SiCoI)的集成光子平台。通过微调制造工艺,我们展示了几乎100%的芯片到晶圆键合面积转移。我们使用基于六氟化硫(SF)的干法蚀刻制造了波导耦合微环谐振器,并展示了1.4×10的适度加载品质因数(Q)。我们通过实验排除了在亚毫瓦片上输入光功率水平下该平台中光折变效应的存在。这个3C-SiCoI平台在包括线性、非线性和量子光子学的大规模集成等应用方面很有前景。