Hainan Yazhou Bay Seed Lab, Sanya, Hainan, China.
State Key Laboratory of Plant Cell and Chromosome Engineering, Institute of Genetics and Developmental Biology, Innovative Academy of Seed Design, Chinese Academy of Sciences, Beijing, China.
Theor Appl Genet. 2023 Mar 13;136(3):51. doi: 10.1007/s00122-023-04248-7.
A high-density genetic map containing 122,620 SNP markers was constructed, which facilitated the identification of eight major flag leaf-related QTL in relatively narrow intervals. The flag leaf plays an important role in photosynthetic capacity and yield potential in wheat. In this study, we used a recombinant inbred line population containing 188 lines derived from a cross between 'Lankao86' (LK86) and 'Ermangmai' to construct a genetic map using the Wheat 660 K single-nucleotide polymorphism (SNP) array. The high-density genetic map contains 122,620 SNP markers spanning 5185.06 cM. It shows good collinearity with the physical map of Chinese Spring and anchors multiple sequences of previously unplaced scaffolds onto chromosomes. Based on the high-density genetic map, we identified seven, twelve, and eight quantitative trait loci (QTL) for flag leaf length (FLL), width (FLW), and area (FLA) across eight environments, respectively. Among them, three, one, and four QTL for FLL, FLW, and FLA are major and stably express in more than four environments. The physical distance between the flanking markers for QFll.igdb-3B/QFlw.igdb-3B/QFla.igdb-3B is only 444 kb containing eight high confidence genes. These results suggested that we could directly map the candidate genes in a relatively small region by the high-density genetic map constructed with the Wheat 660 K array. Furthermore, the identification of environmentally stable QTL for flag leaf morphology laid a foundation for the following gene cloning and flag leaf morphology improvement.
我们构建了一个包含 122620 个 SNP 标记的高密度遗传图谱，这有助于在相对较窄的区间内鉴定出 8 个与旗叶相关的主要数量性状位点。旗叶在小麦的光合能力和产量潜力中起着重要作用。在这项研究中，我们利用一个由 'Lankao86'（LK86）和 'Ermangmai' 杂交衍生的 188 个重组自交系群体，使用小麦 660K 单核苷酸多态性（SNP）芯片构建了一个遗传图谱。该高密度遗传图谱包含 122620 个 SNP 标记，覆盖 5185.06cM。它与中国春的物理图谱具有良好的共线性，并将多个先前未定位的支架序列锚定到染色体上。基于高密度遗传图谱，我们在 8 个环境中分别鉴定出 7、12 和 8 个旗叶长度（FLL）、宽度（FLW）和面积（FLA）的数量性状位点（QTL）。其中，3、1 和 4 个 FLL、FLW 和 FLA 的 QTL 在 4 个以上环境中为主要且稳定表达。侧翼标记之间的物理距离为 QFll.igdb-3B/QFlw.igdb-3B/QFla.igdb-3B 仅为 444kb，包含 8 个高可信度基因。这些结果表明，我们可以通过使用小麦 660K 芯片构建的高密度遗传图谱，直接在相对较小的区域内对候选基因进行定位。此外，鉴定旗叶形态的环境稳定 QTL 为后续基因克隆和旗叶形态改良奠定了基础。
