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使用导波超远程表面等离子体共振监测生物膜生长:概念验证

Biofilm growth monitoring using guided wave ultralong-range Surface Plasmon Resonance: A proof of concept.

作者信息

Bajaj Aabha, Abutoama Mohammad, Isaacs Sivan, Abuleil Marwan J, Yaniv Karin, Kushmaro Ariel, Modic Martina, Cvelbar Uroš, Abdulhalim Ibrahim

机构信息

Ilse Katz Institute for Nanoscale Science and Technology, Ben-Gurion University of the Negev, Beer-Sheva, 84105, Israel.

Department of Electro-optics and Photonics Engineering, ECE School, Ben-Gurion University of the Negev, Beer-Sheva, 84105, Israel.

出版信息

Biosens Bioelectron. 2023 May 15;228:115204. doi: 10.1016/j.bios.2023.115204. Epub 2023 Mar 8.

Abstract

Unwelcomed biofilms are problematic in food industries, surgical devices, marine applications, and wastewater treatment plants, essentially everywhere where there is moisture. Very recently, label-free advanced sensors such as localized and extended surface plasmon resonance (SPR) have been explored as tools for monitoring biofilm formation. However, conventional noble metal SPR substrates suffer from low penetration depth (100-300 nm) into the dielectric medium above the surface, preventing the reliable detection of large entities of single or multi-layered cell assemblies like biofilms which can grow up to a few micrometers or more. In this study, we propose using a plasmonic insulator-metal-insulator (IMI) structure (SiO-Ag-SiO) with a higher penetration depth based on a diverging beam single wavelength format of Kretschmann configuration in a portable SPR device. An SPR line detection algorithm for locating the reflectance minimum of the device helps to view changes in refractive index and accumulation of the biofilm in real-time down to 10 RIU precision. The optimized IMI structure exhibits strong penetration dependence on wavelength and incidence angle. Within the plasmonic resonance, different angles penetrate different depths, showing a maximum near the critical angle. At the wavelength of 635 nm, a high penetration depth of more than 4 μm was obtained. Compared to a thin gold film substrate, for which the penetration depth is only ∼200 nm, the IMI substrate provides more reliable results. The average thickness of the biofilm after 24 h of growth was found to be between 6 and 7 μm with ∼63% live cell volume, as estimated from confocal microscopic images using an image processing tool. To explain this saturation thickness, a graded index biofilm structure is proposed in which the refractive index decreases with the distance from the interface. Furthermore, when plasma-assisted degeneration of biofilms was studied in a semi-real-time format, there was almost no effect on the IMI substrate compared to the gold substrate. The growth rate over the SiO surface was higher than on gold, possibly due to differences between surface charge effects. On the gold, the excited plasmon generates an oscillating cloud of electrons, while for the SiO case, this does not happen. This methodology can be utilized to detect and characterize biofilms with better signal reliability with respect to concentration and size dependence.

摘要

不受欢迎的生物膜在食品工业、手术器械、海洋应用和污水处理厂等存在水分的地方都会引发问题。最近,诸如局域表面等离子体共振(SPR)和扩展表面等离子体共振等无标记先进传感器已被探索用作监测生物膜形成的工具。然而,传统的贵金属SPR基底在表面上方的介电介质中的穿透深度较低(100 - 300纳米),这使得难以可靠检测诸如生物膜之类的单层或多层细胞聚集体的大型实体,因为生物膜可以生长到几微米或更厚。在本研究中,我们提出在便携式SPR设备中,基于Kretschmann配置的发散光束单波长形式,使用具有更高穿透深度的等离子体绝缘体 - 金属 - 绝缘体(IMI)结构(SiO - Ag - SiO)。一种用于定位设备反射率最小值的SPR线检测算法有助于实时观察折射率的变化以及生物膜的积累情况,精度可达10 RIU。优化后的IMI结构对波长和入射角具有强烈的穿透依赖性。在等离子体共振范围内,不同角度穿透不同深度,在临界角附近显示出最大值。在635纳米波长处,获得了超过4微米的高穿透深度。与穿透深度仅约200纳米的薄金膜基底相比,IMI基底提供了更可靠的结果。使用图像处理工具从共聚焦显微镜图像估计,生长24小时后的生物膜平均厚度在6至7微米之间,活细胞体积约为63%。为了解释这种饱和厚度,提出了一种渐变折射率生物膜结构,其中折射率随距界面的距离而降低。此外,当以半实时形式研究等离子体辅助生物膜退化时,与金基底相比,IMI基底几乎没有受到影响。在SiO表面上的生长速率高于在金表面上的生长速率,这可能是由于表面电荷效应的差异。在金表面上,激发的等离子体产生振荡的电子云,而对于SiO情况则不会发生这种情况。这种方法可用于以更好的信号可靠性检测和表征生物膜,且与浓度和尺寸依赖性相关。

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