Electronic Engineering Program, Faculty of Engineering at Universidad del Quindío, 630004, Armenia, Colombia.
Doctoral Program in Physical Sciences, Interdisciplinary Institute of Sciences, Electronic Instrumentation Technology Program, Faculty of Basic Sciences and Technology at Universidad del Quindío, 630004, Armenia, Colombia.
Sci Rep. 2023 Mar 23;13(1):4810. doi: 10.1038/s41598-023-31778-3.
The rapid development of optoelectronic applications for optical-to-electrical conversion has increased the interest in graphene oxide material. Here, graphene oxide films (GOF) were used as source material in an infrared photodetector configuration and the temperature dependence of the electrical conductivity was studied. GOF were prepared by the double-thermal decomposition (DTD) method at 973 K, with a fixed carbonization temperature, in a pyrolysis system, under a controlled nitrogen atmosphere, over quartz substrates. Graphene oxide films were mechanically supported in a photodetector configuration on Bakelite substrates and electrically contacted with copper wires and high-purity silver paint. Morphological images from the GOF's surface were taken employing a scanning electron microscope and observed a homogeneous surface which favored the electrical contacts deposition. Vibrational characteristics were studied employing Raman spectroscopy and determined the typical graphene oxide bands. GOF were used to discuss the effect of temperature on the film's electrical conductivity. Current-voltage (I-V) curves were taken for several temperatures varying from 20 to 300 K and the electrical resistance values were obtained from 142.86 to 2.14 kΩ. The GOF electrical conductivity and bandgap energy (E) were calculated, and it was found that when increasing temperature, the electrical conductivity increased from 30.33 to 2023.97 S/m, similar to a semiconductor material, and E shows a nonlinear change from 0.33 to 0.12 eV, with the increasing temperature. Conduction mechanism was described mainly by three-dimensional variable range hopping (3D VRH). Additionally, measurements of voltage and electrical resistance, as a function of wavelength were considered, for a spectral range between 1300 and 3000 nm. It was evidenced that as the wavelength becomes longer, a greater number of free electrons are generated, which contributes to the electrical current. The external quantum efficiency (EQE) was determined for this proposed photodetector prototype, obtaining a value of 40%, similar to those reported for commercial semiconductor photodetectors. This study provides a groundwork for further development of graphene oxide films with high conductivity in large-scale preparation.
光电应用的快速发展增加了对氧化石墨烯材料的兴趣。在这里,氧化石墨烯薄膜(GOF)被用作红外光电探测器结构中的源材料,并研究了其电导率随温度的变化。GOF 通过在 973 K 下的双热分解(DTD)方法制备,在热解系统中,使用固定的碳化温度,在可控的氮气气氛下,在石英衬底上进行。GOF 通过机械支撑在 Bakelite 衬底上的光电探测器结构中,并通过铜丝和高纯银漆进行电接触。使用扫描电子显微镜对 GOF 的表面形貌图像进行拍摄,观察到均匀的表面,有利于电接触的沉积。采用拉曼光谱研究了振动特性,并确定了典型的氧化石墨烯带。GOF 用于讨论温度对薄膜电导率的影响。在 20 至 300 K 的几个温度下进行电流-电压(I-V)曲线测量,并从 142.86 到 2.14 kΩ 获得电阻值。计算了 GOF 的电导率和带隙能(E),发现随着温度的升高,电导率从 30.33 增加到 2023.97 S/m,类似于半导体材料,而 E 从 0.33 到 0.12 eV 呈非线性变化,随着温度的升高而变化。导电机理主要由三维变程跳跃(3D VRH)描述。此外,还考虑了作为波长函数的电压和电阻测量,光谱范围在 1300 和 3000 nm 之间。结果表明,随着波长的增加,产生了更多的自由电子,这有助于电流。为该原型光电探测器确定了外量子效率(EQE),得到 40%的值,与商用半导体光电探测器报道的值相似。这项研究为在大规模制备中具有高电导率的氧化石墨烯薄膜的进一步发展提供了基础。