Dentaadress Dental Clinic, Malatya, Turkey.
Department of Orthodontics, Faculty of Dentistry, Alanya Alaaddin Keykubat University, Antalya, Turkey.
Clin Oral Investig. 2023 May;27(5):2041-2048. doi: 10.1007/s00784-023-04965-9. Epub 2023 Mar 25.
The aim of this study was to investigate the bone area in the posterior region, which is important for mandibular molar distalization in skeletal class I and class III individuals with normodivergent and hyperdivergent vertical growth patterns.
In this retrospective study, cone-beam computed tomography (CBCT) scans of 120 individuals divided into 4 groups as class I normodivergent (group-I), class I hyperdivergent (group-II), class III normodivergent (group-III), and class III hyperdivergent (group-IV). Retromolar area at crown level measurements was performed on CBCT-derived panoramic radiographs and axial sections. Retromolar area at the root level was measured 2 mm, 4 mm, 6 mm, 8 mm, and 10 mm apical to cemento-enamel junction at CBCT axial sections.
Retromolar area decreased towards the root apex in all groups and smallest retromolar area was level of CEJ in all groups. At any root level, the distal root of the mandibular second molar tooth was in contact with the mandibular inner or outer lingual cortex; 50% in group-I, 46.7% in group-II, 23% in group-III, and 23% in group-IV.
In normodivergent individuals, the retromolar area length at the root level is observed to be higher in class III than in class I at almost every level. In hyperdivergent individuals, on the other hand, only at CEJ level, it is higher in length in class III than in class I. Vertical growth pattern has no effect on the root and crown level retromolar area in class I and class III individuals.
CBCT provides more useful information than panoramic radiographs for patients who are scheduled for large mandibular molar distalization.
本研究旨在探讨对骨骼 I 类和 III 类中垂直生长型为均角和高角的个体进行下颌磨牙远中移动时重要的后区骨量。
本回顾性研究共纳入 120 名个体,分为 4 组:I 类均角组(I 组)、I 类高角组(II 组)、III 类均角组(III 组)和 III 类高角组(IV 组)。在 CBCT 衍生的全景片和轴位片上测量磨牙后区冠方的面积。在 CBCT 轴位片上,自釉牙骨质界下 2mm、4mm、6mm、8mm 和 10mm 处测量根方磨牙后区的面积。
所有组中,磨牙后区的面积均随根尖方向减小,所有组中最小的磨牙后区面积均在釉牙骨质界水平。在任何根方水平,下颌第二磨牙的远中根均与下颌内或外舌侧皮质接触;I 组中为 50%,II 组中为 46.7%,III 组中为 23%,IV 组中为 23%。
在均角个体中,III 类的根方磨牙后区长度在几乎所有水平都高于 I 类。而在高角个体中,只有在釉牙骨质界水平,III 类的长度才高于 I 类。垂直生长型对 I 类和 III 类个体的根方和冠方磨牙后区没有影响。
与全景片相比,CBCT 为计划进行下颌磨牙远中移动的患者提供了更有用的信息。