扫描云纹条纹的动态演化机制。

Dynamic evolution mechanism of scanning moiré fringes.

机构信息

Information Materials and Intelligent Sensing Laboratory of Anhui Province, Key Laboratory of Structure and Functional Regulation of Hybrid Materials of Ministry of Education, Institutes of Physical Science and Information Technology, Anhui University, Hefei, 230601, China.

出版信息

Ultramicroscopy. 2023 Jul;249:113731. doi: 10.1016/j.ultramic.2023.113731. Epub 2023 Apr 6.

DOI:10.1016/j.ultramic.2023.113731

PMID:37043992

Abstract

Scanning moiré fringes (SMFs) in scanning transmission electron microscopy (STEM) have a broad application prospect owing to the low-magnification imaging and hereto the low electron irritation damage, especially in defects localization, strain analysis etc. However, the dynamic evolution mechanism of SMFs is still not clear. In this paper, we carry out in-depth study of SMFs with ferroelectric material GeSe as an example. With the help of combination of aberration-corrected STEM imaging and geometrical model, we discuss the evolution of SMFs with variation of scanning step (magnification), and explain its quasiperiodic behavior in the experiments. Our results will deepen the understanding of SMFs, and may widen their applications under the guidance of the new formation mechanism.

摘要

扫描莫尔条纹（SMFs）在扫描透射电子显微镜（STEM）中有广泛的应用前景，因为它具有低放大倍数成像和低电子刺激损伤的特点，特别是在缺陷定位、应变分析等方面。然而，SMFs 的动态演化机制尚不清楚。在本文中，我们以铁电材料 GeSe 为例，对 SMFs 进行了深入的研究。通过结合像差校正 STEM 成像和几何模型，我们讨论了扫描步长（放大倍数）变化时 SMFs 的演化，并解释了实验中的准周期行为。我们的研究结果将加深对 SMFs 的理解，并可能在新的形成机制的指导下拓宽其应用范围。