[Pattern ERG in X-chromosome juvenile retinoschisis].

Typical electroretinographic findings in x-chromosomal juvenile retinoschisis are a normal a-wave and a reduced b-wave suggesting that the primary defect is located at the level of the bipolar cell layer whereas deeper retinal structures are not basically affected. The marked amplitude reduction in the pattern-ERG suggests to look for the origin of response in the inner retinal layer or in subsequent structures.