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氮化镓纳米线环绕栅晶体管中与温度相关的载流子输运

Temperature-Dependent Carrier Transport in GaN Nanowire Wrap-Gate Transistor.

作者信息

Mallem Siva Pratap Reddy, Puneetha Peddathimula, Choi Yeojin, Baek Seung Mun, An Sung Jin, Im Ki-Sik

机构信息

Advanced Material Research Center, Kumoh National Institute of Technology, Gumi 39177, Republic of Korea.

Department of Robotics and Intelligent Machine Engineering, College of Mechanical and IT Engineering, Yeungnam University, Gyeongsan 38541, Republic of Korea.

出版信息

Nanomaterials (Basel). 2023 May 12;13(10):1629. doi: 10.3390/nano13101629.

Abstract

For the creation of next-generation nanoscale devices, it is crucial to comprehend the carrier transport mechanisms in nanowires. Here, we examine how temperature affects the properties of GaN nanowire wrap-gate transistors (WGTs), which are made via a top-down technique. The predicted conductance in this transistor remains essentially unaltered up to a temperature of 240 K and then increases after that as the temperature rises. This is true for increasing temperature at gate voltages less than threshold voltage ( < ). Sharp fluctuations happen when the temperature rises with a gate voltage of < < . The conductance steadily decreases with increasing temperature after increasing the gate bias to > . These phenomena are possibly attributed to phonon and impurity scattering processes occurring on the surface or core of GaN nanowires.

摘要

对于下一代纳米级器件的制造而言,理解纳米线中的载流子输运机制至关重要。在此,我们研究温度如何影响通过自上而下技术制造的氮化镓纳米线环绕栅晶体管(WGT)的特性。该晶体管中预测的电导在温度达到240 K之前基本保持不变,之后随着温度升高而增加。对于栅极电压小于阈值电压(< )时温度升高的情况,确实如此。当栅极电压满足 < < 时温度升高,会出现急剧波动。将栅极偏置增加到 > 之后,电导随着温度升高而稳步下降。这些现象可能归因于在氮化镓纳米线表面或核心发生的声子和杂质散射过程。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/43b8/10221225/f38ff980d1ed/nanomaterials-13-01629-g001.jpg

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