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忆阻器指纹识别与特征化方法在硬件安全中的应用。

A memristor fingerprinting and characterisation methodology for hardware security.

机构信息

Electronics and Computer Science, University of Southampton, University Road, Southampton, SO17 1BJ, UK.

Centre for Electronics Frontiers, Institute for Integrated Micro and Nano Systems, School of Engineering, The University of Edinburgh, Edinburgh, UK.

出版信息

Sci Rep. 2023 Jun 9;13(1):9392. doi: 10.1038/s41598-023-33051-z.

DOI:10.1038/s41598-023-33051-z
PMID:37296171
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC10256690/
Abstract

The modern IC supply chain encompasses a large number of steps and manufacturers. In many applications it is critically important that chips are of the right quality and are assured to have been obtained from the legitimate supply chain. To this end, it is necessary to be able to uniquely identify systems to aid in supply chain tracking and quality assurance. Many identifiers, however, can be cloned onto counterfeit devices and are therefore untrustworthy. This paper proposes a methodology for using post-CMOS memristor devices as a fingerprint to uniquely identify ICs. To achieve this, memristors' unique and variable I-V characteristics are exploited to produce a fingerprint that can be generally applicable to a wide variety of different memristor technologies and identifiable over time, even where cell retention is non-ideal. In doing so it aims to minimise the hardware required on-chip both to minimise cost and maximise the auditability of the system. The methodology is applied to a [Formula: see text] memristor technology, and shown to be able to identify cells in a set.

摘要

现代集成电路供应链涵盖了大量的步骤和制造商。在许多应用中,至关重要的是芯片的质量是正确的,并保证是从合法的供应链中获得的。为此,有必要能够唯一地识别系统,以帮助供应链跟踪和质量保证。然而,许多标识符可以克隆到假冒设备上,因此是不可信的。本文提出了一种使用 CMOS 后忆阻器器件作为指纹来唯一识别集成电路的方法。为了实现这一目标,利用忆阻器独特的、可变的 I-V 特性来产生一个指纹,这个指纹可以普遍适用于各种不同的忆阻器技术,并可以随着时间的推移进行识别,即使单元保持是非理想的。通过这样做,它旨在最小化芯片上所需的硬件,以最小化成本并最大限度地提高系统的可审计性。该方法应用于[公式:见正文]忆阻器技术,并被证明能够识别一组中的单元。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/070d/10256690/b48b27b30e9b/41598_2023_33051_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/070d/10256690/e5887a218982/41598_2023_33051_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/070d/10256690/fbf5b2028735/41598_2023_33051_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/070d/10256690/45672454b5ab/41598_2023_33051_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/070d/10256690/01a88f309bf8/41598_2023_33051_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/070d/10256690/b48b27b30e9b/41598_2023_33051_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/070d/10256690/e5887a218982/41598_2023_33051_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/070d/10256690/fbf5b2028735/41598_2023_33051_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/070d/10256690/45672454b5ab/41598_2023_33051_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/070d/10256690/01a88f309bf8/41598_2023_33051_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/070d/10256690/b48b27b30e9b/41598_2023_33051_Fig5_HTML.jpg

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