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溶液处理的石墨烯基薄膜中的介观三维电荷传输:多尺度分析

Mesoscopic 3D Charge Transport in Solution-Processed Graphene-Based Thin Films: A Multiscale Analysis.

作者信息

Boschi Alex, Kovtun Alessandro, Liscio Fabiola, Xia Zhenyuan, Kim Kyung Ho, Avila Samuel Lara, De Simone Sara, Mussi Valentina, Barone Carlo, Pagano Sergio, Gobbi Marco, Samorì Paolo, Affronte Marco, Candini Andrea, Palermo Vincenzo, Liscio Andrea

机构信息

Consiglio Nazionale delle Ricerche, Istituto per la Sintesi Organica e la Fotoreattività, (CNR-ISOF), via Gobetti 101, Bologna, 40129, Italy.

Istituto Italiano di Tecnologia, IIT - CNI, Laboratorio NEST, piazza S. Silvestro 12, Pisa, 56127, Italy.

出版信息

Small. 2023 Oct;19(42):e2303238. doi: 10.1002/smll.202303238. Epub 2023 Jun 17.

DOI:10.1002/smll.202303238
PMID:37330652
Abstract

Graphene and related 2D material (GRM) thin films consist of 3D assembly of billions of 2D nanosheets randomly distributed and interacting via van der Waals forces. Their complexity and the multiscale nature yield a wide variety of electrical characteristics ranging from doped semiconductor to glassy metals depending on the crystalline quality of the nanosheets, their specific structural organization ant the operating temperature. Here, the charge transport (CT) mechanisms are studied that are occurring in GRM thin films near the metal-insulator transition (MIT) highlighting the role of defect density and local arrangement of the nanosheets. Two prototypical nanosheet types are compared, i.e., 2D reduced graphene oxide and few-layer-thick electrochemically exfoliated graphene flakes, forming thin films with comparable composition, morphology and room temperature conductivity, but different defect density and crystallinity. By investigating their structure, morphology, and the dependence of their electrical conductivity on temperature, noise and magnetic-field, a general model is developed describing the multiscale nature of CT in GRM thin films in terms of hopping among mesoscopic bricks, i.e., grains. The results suggest a general approach to describe disordered van der Waals thin films.

摘要

石墨烯及相关二维材料(GRM)薄膜由数十亿个二维纳米片的三维组装体组成,这些纳米片随机分布并通过范德华力相互作用。它们的复杂性和多尺度性质产生了各种各样的电学特性,从掺杂半导体到玻璃态金属,这取决于纳米片的晶体质量、其特定的结构组织以及工作温度。在此,研究了在金属 - 绝缘体转变(MIT)附近的GRM薄膜中发生的电荷传输(CT)机制,突出了缺陷密度和纳米片局部排列的作用。比较了两种典型的纳米片类型,即二维还原氧化石墨烯和几层厚的电化学剥离石墨烯薄片,它们形成的薄膜具有可比的组成、形态和室温电导率,但缺陷密度和结晶度不同。通过研究它们的结构、形态以及电导率对温度、噪声和磁场的依赖性,建立了一个通用模型,该模型从介观砖块(即晶粒)之间的跳跃角度描述了GRM薄膜中CT的多尺度性质。结果表明了一种描述无序范德华薄膜的通用方法。

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