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微机电系统(MEMS)陀螺仪振动系统的跳跃和拉入不稳定性

Jump and Pull-in Instability of a MEMS Gyroscope Vibrating System.

作者信息

Zhu Yijun, Shang Huilin

机构信息

School of Mechanical Engineering, Shanghai Institute of Technology, Shanghai 201418, China.

出版信息

Micromachines (Basel). 2023 Jul 8;14(7):1396. doi: 10.3390/mi14071396.

Abstract

Jump and pull-in instability are common nonlinear dynamic behaviors leading to the loss of the performance reliability and structural safety of electrostatic micro gyroscopes. To achieve a better understanding of these initial-sensitive phenomena, the dynamics of a micro gyroscope system considering the nonlinearities of the stiffness and electrostatic forces are explored from a global perspective. Static and dynamic analyses of the system are performed to estimate the threshold of the detecting voltage for static pull-in, and dynamic responses are analyzed in the driving and detecting modes for the case of primary resonance and 1:1 internal resonance. The results show that, when the driving voltage frequency is a bit higher than the natural frequency, a high amplitude of the driving AC voltage may induce the coexistence of bistable periodic responses due to saddle-node bifurcation of the periodic solution. Basins of attraction of bistable attractors provide evidence that disturbance of the initial conditions can trigger a jump between bistable attractors. Moreover, the Melnikov method is applied to discuss the condition for pull-in instability, which can be ascribed to heteroclinic bifurcation. The validity of the prediction is verified using the sequences of safe basins and unsafe zones for dynamic pull-in. It follows that pull-in instability can be caused and aggravated by the increase in the amplitude of the driving AC voltage.

摘要

跳跃和拉入不稳定性是常见的非线性动力学行为,会导致静电微陀螺仪的性能可靠性和结构安全性丧失。为了更好地理解这些初始敏感现象,从全局角度研究了考虑刚度和静电力非线性的微陀螺仪系统动力学。对系统进行了静态和动态分析,以估计静态拉入检测电压的阈值,并在主共振和1:1内共振情况下分析了驱动和检测模式下的动态响应。结果表明,当驱动电压频率略高于固有频率时,高幅值的驱动交流电压可能会由于周期解的鞍结分岔而导致双稳周期响应共存。双稳吸引子的吸引域证明了初始条件的扰动可以触发双稳吸引子之间的跳跃。此外,应用梅尔尼科夫方法讨论了拉入不稳定性的条件,该条件可归因于异宿分岔。使用动态拉入的安全盆和不安全区序列验证了预测的有效性。结果表明,驱动交流电压幅值的增加会导致并加剧拉入不稳定性。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c75d/10383771/fc17fe785ed7/micromachines-14-01396-g001.jpg

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