Zhang Yifan, Luo Bing, Fu Mingli, Jia Lei, Chen Chi, Zhou Gang, Wang Chuang
Electric Power Research Institute, China Southern Power Grid, Guangzhou 510663, China.
National Engineering Research Center for UHV Power Technology and New Power Equipment, Guangzhou 510663, China.
Molecules. 2023 Jul 20;28(14):5537. doi: 10.3390/molecules28145537.
In the design and manufacturing of epoxy resin insulation components, complex structures can be achieved through multiple pours, thereby forming the structure of interface of laminated epoxy resin. This type of interface structure is often considered a weak link in performance which can easily accumulate charges and cause electric field distortion. However, research on the interlayer interface of epoxy resin has received little attention. In this study, epoxy samples with and without interlayer interfaces were prepared, and the space charge accumulation characteristics and trap characteristics of the samples were analyzed via pulsed electro-acoustic (PEA) and thermally stimulated depolarization current (TSDC) methods. The experimental results indicate that the Maxwell-Wagner interface polarization model cannot fully explain the charge accumulation at the interface. Due to the influence of the secondary curing, the functional groups in the post-curing epoxy resin can move and react with the partially reacted functional groups in the prefabricated epoxy resin layer, resulting in a weak cross-linking network at the interface. With the increase in temperature, the molecular chain segments in the weak cross-linked region of the interface become more active and introduce deep traps at the interface, thereby exacerbating the accumulation of interface charges. In addition, due to the influence of interface polarization and weak cross-linking, the ability of the interface charges to cause field strength distortions decreases with the increase in applied field strength. This research study can provide a theoretical reference for the interfacial space charge transport characteristics of epoxy-cured cross-linked layers and provide ideas for regulating interfacial cross-linking to suppress interfacial charge accumulation.
在环氧树脂绝缘部件的设计与制造中,通过多次浇筑可实现复杂结构,从而形成层压环氧树脂的界面结构。这种界面结构通常被认为是性能上的薄弱环节,容易积累电荷并导致电场畸变。然而,对环氧树脂层间界面的研究却很少受到关注。在本研究中,制备了有和没有层间界面的环氧树脂样品,并通过脉冲电声(PEA)和热刺激去极化电流(TSDC)方法分析了样品的空间电荷积累特性和陷阱特性。实验结果表明,麦克斯韦 - 瓦格纳界面极化模型不能完全解释界面处的电荷积累。由于二次固化的影响,后固化环氧树脂中的官能团会移动并与预制环氧树脂层中部分反应的官能团发生反应,导致界面处的交联网络较弱。随着温度升高,界面弱交联区域的分子链段变得更加活跃,并在界面处引入深陷阱,从而加剧界面电荷的积累。此外,由于界面极化和弱交联的影响,界面电荷引起场强畸变的能力随外加场强的增加而降低。本研究可为环氧树脂固化交联层的界面空间电荷输运特性提供理论参考,并为调节界面交联以抑制界面电荷积累提供思路。