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在近表面层重离子运动轨迹重叠效应情况下,辐照通量密度对AlN中缺陷结构形成影响的研究。

Study of the Influence of the Irradiation Flux Density on the Formation of a Defect Structure in AlN in the Case of the Effect of Overlapping of the Heavy Ion Motion Trajectories in the Near-Surface Layer.

作者信息

Bikhert Yeugeniy V, Kozlovskiy Artem L, Popov Anatoli I, Zdorovets Maxim V

机构信息

Engineering Profile Laboratory, L.N. Gumilyov Eurasian National University, Satpaev Str. 5, Astana 010008, Kazakhstan.

Laboratory of Solid State Physics, The Institute of Nuclear Physics, Almaty 050032, Kazakhstan.

出版信息

Materials (Basel). 2023 Jul 25;16(15):5225. doi: 10.3390/ma16155225.

Abstract

The aim of this paper is to test the previously stated hypothesis and several experimental facts about the effect of the ion flux or ion beam current under irradiation with heavy ions on the radiation damage formation in the ceramic near-surface layer and their concentration. The hypothesis is that, when considering the possibilities of using ion irradiation (usually with heavy ions) for radiation damage simulation at a given depth, comparable to neutron irradiation, it is necessary to consider the rate factor for the set of atomic displacements and their accumulation. Using the methods of X-ray diffraction analysis, Raman and UV-Vis spectroscopy, alongside photoluminescence, the mechanisms of defect formation in the damaged layer were studied by varying the current of the Xe ion beam with an energy of 230 MeV. As a result of the experimental data obtained, it was found that, with the ion beam current elevation upon the irradiation of nitride ceramics (AlN) with heavy Xe ions, structural changes have a pronounced dependence on the damage accumulation rate. At the same time, the variation of the ion beam current affects the main mechanisms of defect formation in the near-surface layer. It has been found that at high values of flux ions, the dominant mechanism in damage to the surface layer is the mechanism of the formation of vacancy defects associated with the replacement of nitrogen atoms by oxygen atoms, as well as the formation of complexes.

摘要

本文的目的是验证先前提出的假设以及关于重离子辐照下离子通量或离子束电流对陶瓷近表层辐射损伤形成及其浓度影响的若干实验事实。该假设为,在考虑使用离子辐照(通常为重离子)在与中子辐照相当的给定深度模拟辐射损伤的可能性时,有必要考虑原子位移及其累积集合的速率因素。利用X射线衍射分析、拉曼光谱和紫外可见光谱方法以及光致发光,通过改变能量为230 MeV的Xe离子束电流,研究了损伤层中缺陷形成的机制。根据获得的实验数据发现,在用重Xe离子辐照氮化物陶瓷(AlN)时,随着离子束电流升高,结构变化对损伤累积速率有显著依赖性。同时,离子束电流的变化影响近表层缺陷形成的主要机制。已发现,在高通量离子值时,表层损伤的主导机制是与氮原子被氧原子取代相关的空位缺陷形成机制以及络合物的形成。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d965/10419494/4c14bd15a034/materials-16-05225-g001.jpg

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