Toriyama Michael Y, Carranco Adam N, Snyder G Jeffrey, Gorai Prashun
Northwestern University, Evanston, IL 60208, USA.
Colorado School of Mines, Golden, CO 80401, USA.
Mater Horiz. 2023 Oct 2;10(10):4256-4269. doi: 10.1039/d3mh01013a.
Thermoelectric (TE) cooling is an environment-friendly alternative to vapor compression cooling. New TE materials with high coefficients of performance are needed to further advance this technology. Narrow-gap semiconductors and semimetals have garnered interest for Peltier cooling, yet large-scale computational searches often rely on material descriptors that do not account for bipolar conduction effects. In this work, we derive three material descriptors to assess the TE performances of narrow-gap semiconductors and semimetals - band gap, n- and p-type TE quality factors, and the asymmetry in transport between the majority and minority carriers. We show that a large asymmetry is critical to achieving high TE performance through minimization of bipolar conduction effects. We validate the predictive power of the descriptors by correctly identifying MgBi and BiTe as high-performing room-temperature TE materials. By applying these descriptors to a broad set of 650 Zintl phases, we identify three candidate room-temperature TE materials, namely SrSb, ZnAs, and NaCdSb. The proposed material descriptors will enable fast, targeted searches of narrow-gap semiconductors and semimetals for low-temperature TEs. We further propose a refined TE quality factor, , which is a composite descriptor of the peak in materials exhibiting significant bipolar conduction; can be used to compare the TE performances of narrow-gap semiconductors.
热电(TE)冷却技术是一种对环境友好的蒸汽压缩冷却替代方案。为了进一步推进这项技术,需要性能系数更高的新型TE材料。窄带隙半导体和半金属已引起人们对珀尔帖冷却的关注,但大规模的计算搜索通常依赖于未考虑双极传导效应的材料描述符。在这项工作中,我们推导出三个材料描述符来评估窄带隙半导体和半金属的TE性能——带隙、n型和p型TE品质因数,以及多数载流子和少数载流子之间传输的不对称性。我们表明,通过最小化双极传导效应,大的不对称性对于实现高TE性能至关重要。我们通过正确识别MgBi和BiTe作为高性能室温TE材料,验证了这些描述符的预测能力。通过将这些描述符应用于广泛的650种津特耳相,我们确定了三种候选室温TE材料,即SrSb、ZnAs和NaCdSb。所提出的材料描述符将能够快速、有针对性地搜索用于低温TE的窄带隙半导体和半金属。我们进一步提出了一个改进的TE品质因数,它是在表现出显著双极传导的材料中峰值的复合描述符;可用于比较窄带隙半导体的TE性能。