Zhang Yuemin, Guo Haiyun, Cao Jun, Wu Xuefeng, Jia Hewei, Chang Andong
School of Mechanical and Power Engineering, Henan Polytechnic University, Jiaozuo 454000, China.
Micromachines (Basel). 2023 Jul 31;14(8):1538. doi: 10.3390/mi14081538.
Wire-bonding technology is the most commonly used chip interconnection technology in microelectronic packaging. Metal bonding wire is the key material for wire bonding and plays an important role in the reliability of electronic devices. In recent years, palladium-plated copper (PdCu) bonding wire has been widely used because of its low cost, good electrical and thermal conductivity, the fact that it is not easy to oxidize, and its high reliability. Therefore, it is necessary to review its research progress. In this paper, the preparation and application of palladium-plated copper bonding wire are reviewed. Firstly, the preparation methods of electroplating, electroless plating, and direct plating are introduced. Secondly, the factors affecting the distribution of Pd in free air balls and bonding interfaces, the effect of Pd on the formation and growth of intermetallic compounds in PdCu wire, stitch bond, and reliability of PdCu wire are summarized and analyzed in the application process. Finally, its development prospect is prospected. Hopefully, this review can help readers to have a comprehensive understanding of the preparation and application of palladium-plated copper bonding wires, and can accelerate the promotion of its application in more fields in the future.
引线键合技术是微电子封装中最常用的芯片互连技术。金属键合线是引线键合的关键材料,对电子器件的可靠性起着重要作用。近年来,镀钯铜线(PdCu)因其成本低、电导率和热导率良好、不易氧化以及可靠性高而被广泛应用。因此,有必要对其研究进展进行综述。本文对镀钯铜线的制备与应用进行了综述。首先,介绍了电镀、化学镀和直接镀的制备方法。其次,总结并分析了在应用过程中影响Pd在自由空气球和键合界面中分布的因素、Pd对PdCu线中金属间化合物形成和生长的影响、缝合键合以及PdCu线的可靠性。最后,对其发展前景进行了展望。希望这篇综述能够帮助读者全面了解镀钯铜线的制备与应用,并在未来加速其在更多领域的推广应用。