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具有不同光捕获结构的高折射率聚氨酯对太阳能电池的减反射效果。

Anti-reflection effect of high refractive index polyurethane with different light trapping structures on solar cells.

作者信息

Wang Shengxuan, Cui Hao, Jin Sijia, Pi Xiaodong, He Haiyan, Shou Chunhui, Yang Deren, Wang Lei

机构信息

State Key Laboratory of Silicon and Advanced Semiconductor Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, China.

Institute of Advanced Semiconductors and Zhejiang Provincial Key Laboratory of Power Semiconductor Materials and Devices, Hangzhou Innovation Center, Zhejiang University, Hangzhou 311200, China.

出版信息

Heliyon. 2023 Sep 19;9(9):e20264. doi: 10.1016/j.heliyon.2023.e20264. eCollection 2023 Sep.

Abstract

The textured surfaces to reduce light reflectivity by using acid-alkali chemical etching and SiN films are generally necessary for commercial crystalline silicon solar cells. However, this etching process requires a large amount of environmentally harmful acid-alkali solution and has limited options for texture and size. To overcome these disadvantages, a new anti-reflection strategy is proposed in this study, which is using soft nanoimprint lithography to prepare the textured structures on the outside of the SiN films. The polyurethane with a high refractive index of 1.64 is selected as the texture material, and different templates are selected to prepare it into different light trapping structures, including positive-inverted pyramids, inverted lace cones, and positive-inverted moth-eye nanostructures allowing for easy customization of the textured structures. The finite element simulation and experiments demonstrate that these light trapping structures have a wide spectrum anti-reflection performance in visible and near-infrared bands. With the back surface of the commercial passivated emitter rear contact (PERC) bi-facial solar cells as the imprint substrates, some light trapping structures can reduce the surface weighted average light reflectivity (R) at the band of 300-1200 nm from 18.31% to less than 10% and the optimal structures can reduce R to 8.71%. This anti-reflection strategy can also be applied to thin-film solar cells and crystalline silicon solar cells of other structures, such as HIT, Topcon, Perovskite/c-Si tandem, and so forth, which shows great development potential.

摘要

对于商业晶体硅太阳能电池而言,通常需要通过酸碱化学蚀刻和氮化硅(SiN)薄膜来制备具有纹理的表面以降低光反射率。然而,这种蚀刻工艺需要大量对环境有害的酸碱溶液,并且在纹理和尺寸方面的选择有限。为了克服这些缺点,本研究提出了一种新的抗反射策略,即使用软纳米压印光刻技术在SiN薄膜外部制备纹理结构。选择折射率为1.64的高折射率聚氨酯作为纹理材料,并选择不同的模板将其制备成不同的光捕获结构,包括正倒金字塔、倒蕾丝锥和正倒蛾眼纳米结构,从而便于定制纹理结构。有限元模拟和实验表明,这些光捕获结构在可见光和近红外波段具有宽光谱抗反射性能。以商业钝化发射极背接触(PERC)双面太阳能电池的背面作为压印基板,一些光捕获结构可以将300 - 1200 nm波段的表面加权平均光反射率(R)从18.31%降低到10%以下,最佳结构可将R降低到8.71%。这种抗反射策略还可以应用于薄膜太阳能电池和其他结构的晶体硅太阳能电池,如异质结(HIT)、隧穿氧化层钝化接触(Topcon)、钙钛矿/晶体硅串联电池等,显示出巨大的发展潜力。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/338d/10560017/cb65426b7e15/ga1.jpg

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