Berujon Sebastien, Cojocaru Ruxandra, Piault Pierre, Celestre Rafael, Roth Thomas, Barrett Raymond, Ziegler Eric
European Synchrotron Radiation Facility, CS 40220, F-38043 Grenoble Cedex 9, France.
J Synchrotron Radiat. 2020 Mar 1;27(Pt 2):293-304. doi: 10.1107/S1600577520000508. Epub 2020 Feb 20.
A parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad. 27, 284-292] reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. Shown here are experimental applications of the technique for characterizing both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with a minimum amount of wavefront distortion. It is also recalled how such methods can facilitate online optimization of active optics.
一篇平行论文[贝鲁琼、科乔卡鲁、皮亚尔、塞莱斯特、罗斯、巴雷特和齐格勒（2020年），《同步辐射杂志》27卷，第284 - 292页]从理论上回顾了一些基于随机调制的X射线波前传感可用处理方案。这里展示的是该技术用于表征折射和反射光学元件的实验应用。这些快速且准确的X射线波长计量方法有助于制造能以最小波前畸变传输X射线束的X射线光学器件。还回顾了此类方法如何能促进有源光学器件的在线优化。
