Rezeq Moh'd, Abbas Yawar, Wen Boyu, Wasilewski Zbig, Ban Dayan
Department of Physics, Khalifa University of Science and Technology POB 127788 Abu Dhabi United Arab Emirates
System on Chip Centre, Khalifa University of Science and Technology POB 127788 Abu Dhabi United Arab Emirates.
Nanoscale Adv. 2023 Sep 18;5(20):5562-5569. doi: 10.1039/d3na00638g. eCollection 2023 Oct 10.
Indium arsenide (InAs) quantum dots (QDs) grown by molecular beam epitaxy (EBM) on gallium arsenide (GaAs) substrates have exhibited quantized charge-trapping characteristics. An electric charge can be injected in a single QD by a gold-coated AFM nano-probe placed directly on it using a conductive-mode atomic force microscope (C-AFM). The results revealed separate current-voltage (-) curves during consecutive measurements, where the turn-on voltages measured at the subsequent voltage sweeps are incrementally lower than that at the initial sweep. We demonstrate that the charge state of the QD can change over a long enough time by measuring the - data on the same QD at different time intervals. Discrete energy states (here, five states) have been observed due to the quantized charge leakage from the QD into the surrounding materials. These quantum states with five energy levels have been verified using quantum theory analysis of the quantum-well with the help of a numerical simulation model, which depends on the QD dimensions. The size of the quantum-well in the model is in good agreement with the actual QD size, whose lateral dimension is confirmed using a scanning electron microscope. At the same time, the height is estimated from the atomic force microscope topography.
通过分子束外延(MBE)在砷化镓(GaAs)衬底上生长的砷化铟(InAs)量子点(QD)表现出量子化的电荷俘获特性。使用导电模式原子力显微镜(C-AFM),通过直接放置在单个量子点上的镀金原子力显微镜纳米探针,可以将电荷注入到该量子点中。结果显示,在连续测量过程中,电流-电压(I-V)曲线是分开的,后续电压扫描时测得的开启电压比初始扫描时的开启电压逐渐降低。通过在不同时间间隔对同一个量子点测量I-V数据,我们证明了量子点的电荷状态可以在足够长的时间内发生变化。由于量子点中的电荷泄漏到周围材料中是量子化的,因此观察到了离散的能量状态(这里是五个状态)。借助数值模拟模型,通过对量子阱进行量子理论分析,验证了这些具有五个能级的量子态,该模型取决于量子点的尺寸。模型中量子阱的尺寸与实际量子点尺寸吻合良好,其横向尺寸通过扫描电子显微镜确认。同时,高度由原子力显微镜形貌估计得出。