Yang Boshuo, Wu Minyang, Ma Yinhang, Jiang Hanyang, Yang Fujun
Opt Express. 2023 Oct 9;31(21):35100-35112. doi: 10.1364/OE.504025.
What we believe to be a new electronic speckle pattern interferometry (ESPI) configuration is being developed for simultaneous three-dimensional deformation measurements. In this ESPI system, two pairs of symmetrical illuminating arrangement with dual-wavelength lights were used to independently sense two in-plane deformation components, one Michelson interferometer-based set illuminating with the other wavelength light was utilized to measure out-of-plane deformation. The color speckle interferogram was split into four sub-patterns by a prism, three of them were filtered by three different bandpass dichroic filters and recorded by one monochrome camera. Micro-rotation testing work firstly verifies the validation of the proposed phase-shifting device. Three-dimensional deformation information was simultaneous obtained by using temporal phase-shift method. All strain components related to the specimen surface deformation were further determined by numerical differential. The experimental results of a tested specimen were excellently consistent with those of FEM simulation, which verified the validation and feasibility of the proposed ESPI system for measuring 3D deformation.
我们正在开发一种我们认为是全新的电子散斑图案干涉测量（ESPI）配置，用于同时进行三维变形测量。在这个ESPI系统中，使用两对具有双波长光的对称照明装置来独立感测两个面内变形分量，利用一个基于迈克尔逊干涉仪的装置用另一种波长的光进行照明来测量面外变形。彩色散斑干涉图由一个棱镜分成四个子图案，其中三个由三个不同的带通二向色滤光片滤波，并由一台单色相机记录。微旋转测试工作首先验证了所提出的相移装置的有效性。通过使用时间相移方法同时获得三维变形信息。通过数值微分进一步确定与试样表面变形相关的所有应变分量。一个测试试样的实验结果与有限元模拟结果非常吻合，这验证了所提出的用于测量三维变形的ESPI系统的有效性和可行性。
