Sun Ping
College of Physics and Electronics, Shandong Normal University, Jinan 250014, China.
Appl Opt. 2007 May 20;46(15):2859-62. doi: 10.1364/ao.46.002859.
A method for the isolation of two-dimensional (2D) displacement components by using one phase map obtained by phase-shifting electronic speckle pattern interferometry (ESPI) is presented. When the typical ESPI is used for displacement measurement, a mixed phase distribution of deformation is measured. If the deformation of the object is symmetrical, two components of deformation can be separated from each other by using the mixed phase distribution. We turn over the mixed phase map first to obtain the second phase map, and then overlap them. Two displacement components can be separated from each other by boundary alignment and algebraic calculation between the two phase maps. This method has been proved feasible by a typical three-point bending experiment. Some experimental results are offered and compared with the results obtained by a dual-beam symmetrical illuminations experiment. This technique presented provides an alternative approach to 2D deformation measurement.
提出了一种利用相移电子散斑干涉术（ESPI）获得的一幅相位图来分离二维（2D）位移分量的方法。当使用典型的ESPI进行位移测量时，测量的是变形的混合相位分布。如果物体的变形是对称的，那么可以利用该混合相位分布将两个变形分量彼此分离。我们首先翻转混合相位图以获得第二幅相位图，然后将它们重叠。通过两幅相位图之间的边界对齐和代数计算，可以将两个位移分量彼此分离。通过一个典型的三点弯曲实验已证明该方法是可行的。给出了一些实验结果，并与双光束对称照明实验获得的结果进行了比较。所提出的这项技术为二维变形测量提供了一种替代方法。
