Division of Cardiovascular Medicine, Yale University School of Medicine, New Haven, Connecticut.
Department of Medicine, Jacobi Medical Center, Bronx, New York.
Am J Cardiol. 2023 Dec 15;209:203-211. doi: 10.1016/j.amjcard.2023.09.064. Epub 2023 Oct 17.
New-onset or worsening tricuspid regurgitation (TR) is a well-established complication encountered after cardiac implantable electronic devices (CIEDs). However, there are limited and conflicting data on the true incidence and prognostic implications of this complication. This study aimed to bridge this current gap in the literature. Electronic databases MEDLINE, Embase, and Web of Science were systematically searched from inception to March 2023, for studies reporting the incidence and/or prognosis of CIED-associated new or worsening TR. Potentially eligible studies were screened and selected according to the Preferred Reporting Items for Systematic Reviews and Meta-Analyses guidelines. A random effect model meta-analysis and meta-regression analysis were performed, and I-squared statistic was used to assess heterogeneity. A total of 52 eligible studies, with 130,759 patients were included in the final quantitative analysis with a mean follow-up period of 25.5 months. The mean age across included studies was 69.35 years, and women constituted 46.6% of the study population. The mean left ventricular ejection fraction was 50.15%. The incidence of CIED-associated TR was 24% (95% confidence interval [CI] 20% to 28%, p <0.001) with an odds ratio of 2.44 (95% CI 1.58 to 3.77, p <0.001). CIED-associated TR was independently associated with an increased risk of all-cause mortality (adjusted hazard ratio [aHR] 1.52, 95% CI 1.36 to 1.69, p <0.001), heart failure (HF) hospitalizations (aHR 1.82, 95% CI 1.19 to 2.78, p = 0.006), and the composite of mortality and HF hospitalizations (aHR 1.96, 95% CI 1.33 to 2.87, p = 0.001) in the follow-up period. In conclusion, CIED-associated TR occurred in nearly one-fourth of patients after device implantation and was associated with an increased risk of all-cause mortality and HF hospitalizations.
新出现或恶化的三尖瓣反流(TR)是心脏植入式电子设备(CIED)后常见的并发症。然而,关于这种并发症的真实发生率和预后意义的相关数据有限且存在争议。本研究旨在填补这一文献空白。从创建到 2023 年 3 月,系统地检索了 MEDLINE、Embase 和 Web of Science 电子数据库,以查找报告 CIED 相关新发或加重 TR 的发生率和/或预后的研究。根据系统评价和荟萃分析的首选报告项目指南,筛选和选择潜在合格的研究。进行了随机效应模型荟萃分析和荟萃回归分析,并使用 I 平方统计量评估异质性。最终定量分析共纳入 52 项合格研究,涉及 130759 例患者,平均随访时间为 25.5 个月。纳入研究的平均年龄为 69.35 岁,女性占研究人群的 46.6%。平均左心室射血分数为 50.15%。CIED 相关 TR 的发生率为 24%(95%可信区间 [CI] 20%至 28%,p<0.001),优势比为 2.44(95%CI 1.58 至 3.77,p<0.001)。CIED 相关 TR 与全因死亡率(调整后的危险比 [aHR] 1.52,95%CI 1.36 至 1.69,p<0.001)、心力衰竭(HF)住院(aHR 1.82,95%CI 1.19 至 2.78,p=0.006)和死亡率和 HF 住院的复合终点(aHR 1.96,95%CI 1.33 至 2.87,p=0.001)的风险增加独立相关。总之,在设备植入后,近四分之一的患者发生了与 CIED 相关的 TR,并且与全因死亡率和 HF 住院的风险增加相关。