Department of Cardiac Pacing and Electrophysiology, The First Affiliated Hospital of Xinjiang Medical University, Urumqi, P.R., China; Xinjiang Key Laboratory of Cardiac Electrophysiology and Remodeling, The First Affiliated Hospital of Xinjiang Medical University, Urumqi, P.R., China.
Department of Cardiac Pacing and Electrophysiology, The First Affiliated Hospital of Xinjiang Medical University, Urumqi, P.R., China; Xinjiang Key Laboratory of Cardiac Electrophysiology and Remodeling, The First Affiliated Hospital of Xinjiang Medical University, Urumqi, P.R., China.
J Cardiothorac Vasc Anesth. 2022 Jun;36(6):1741-1755. doi: 10.1053/j.jvca.2021.06.025. Epub 2021 Jun 25.
This study aimed to determine the pooled incidence, risk factors, and clinical prognosis of tricuspid regurgitation (TR) deterioration after implantation of a cardiac implantable electronic device (CIED). The study was designed as a meta-analysis of randomized controlled trials and observational studies. Patients with indications for CIEDs were selected as participants and CIED implantation was the intervention. PubMed, EMBASE, the Cochrane Library, China National Knowledge Infrastructure, Wanfang Data, and China Science and Technology Journal Database were searched systematically to identify studies. Thirty-seven studies with 8,144 patients were included. The pooled incidence of TR deterioration of at least one grade was 25.1% (95% confidence interval [CI], 20.9-29.3; Z = 11.60; p < 0.01; I = 94.8%, p < 0.01). Compared with TR incidence after permanent pacemaker implantation, that after implantable cardioverter-defibrillator implantation did not significantly increase (22.68% v 29.18%; odds ratio [OR], 0.615; 95% CI, 0.271-1.339; Z =1.16; p = 0.246). The pooled incidence of TR deterioration of at least two grades was 9.4% (95% CI, 6.6-12.1; Z = 6.72; p < 0.01; I = 86.0%, p < 0.01). Lead interference (OR, 8.704; 95% CI,4.450-17.028; Z= 6.32; p < 0.001) and pacemaker implantation time (OR, 1.153; 95% CI, 1.082-1.229; Z = 4.37; p < 0.001) were risk factors for worsening TR. Baseline atrial fibrillation, age, baseline mild TR, and left ventricular ejection fraction were not associated with TR. All-cause mortality (>one year after pacemaker implantation) was higher in patients with TR deterioration (hazard ratio, 1.598; 95% CI, 1.275-2.002; Z = 4.07; p < 0.01; I = 0%). TR is a common complication after CIED implantation. Lead interference and pacemaker implantation time were risk factors for TR worsening. Compared with patients without TR deterioration after pacemaker implantation, patients with TR deterioration had a poorer prognosis.
本研究旨在确定心脏植入式电子设备(CIED)植入后三尖瓣反流(TR)恶化的累积发生率、危险因素和临床预后。该研究设计为随机对照试验和观察性研究的荟萃分析。选择有 CIED 适应证的患者作为参与者,CIED 植入作为干预措施。系统检索 PubMed、EMBASE、Cochrane 图书馆、中国知网、万方数据和中国科技期刊数据库,以确定研究。共纳入 37 项研究,涉及 8144 例患者。TR 恶化至少 1 级的累积发生率为 25.1%(95%置信区间[CI],20.9-29.3;Z=11.60;p<0.01;I=94.8%,p<0.01)。与永久性起搏器植入后 TR 发生率相比,植入式心律转复除颤器植入后 TR 发生率无显著增加(22.68%比 29.18%;比值比[OR],0.615;95%CI,0.271-1.339;Z=1.16;p=0.246)。TR 恶化至少 2 级的累积发生率为 9.4%(95%CI,6.6-12.1;Z=6.72;p<0.01;I=86.0%,p<0.01)。导线干扰(OR,8.704;95%CI,4.450-17.028;Z=6.32;p<0.001)和起搏器植入时间(OR,1.153;95%CI,1.082-1.229;Z=4.37;p<0.001)是 TR 恶化的危险因素。基线心房颤动、年龄、基线轻度 TR 和左心室射血分数与 TR 无关。TR 恶化患者全因死亡率(起搏器植入后>1 年)更高(风险比,1.598;95%CI,1.275-2.002;Z=4.07;p<0.01;I=0%)。TR 是 CIED 植入后的常见并发症。导线干扰和起搏器植入时间是 TR 恶化的危险因素。与起搏器植入后无 TR 恶化的患者相比,TR 恶化的患者预后较差。