Bistrović M, Bisćan M, Viculin T
Radiother Oncol. 1986 Oct;7(2):175-80. doi: 10.1016/s0167-8140(86)80097-4.
The survival curves of V 79 cells were compared for various types of sparsely ionizing radiation: 20 kV, 70 kV and 42 MV X-rays, 60Co gamma-rays and 40 MeV electrons. A carefully calibrated thin window chamber was used for accurate dosimetry. The survival curves for cells exposed to 20 kV X-rays and 70 kV X-rays differed from that for 60Co gamma-rays only by a dose-scaling factor t(RBE). RBE with respect to 60Co gamma-rays could then be considered as dose-independent: 1.19 +/- 0.06 for 70 kV X-rays and 1.40 +/- 0.07 for 20 kV X-rays. RBE of 42 MV X-rays and 40 MeV electrons was not significantly different from 1.
比较了V79细胞在各种类型的低LET辐射下的存活曲线:20 kV、70 kV和42 MV的X射线、60Coγ射线以及40 MeV电子。使用经过精心校准的薄窗电离室进行精确剂量测定。暴露于20 kV X射线和70 kV X射线的细胞的存活曲线与60Coγ射线的存活曲线仅相差一个剂量缩放因子t(RBE)。相对于60Coγ射线的RBE可被视为与剂量无关:70 kV X射线的RBE为1.19±0.06,20 kV X射线的RBE为1.40±0.07。42 MV X射线和40 MeV电子的RBE与1无显著差异。