Czifra Árpád, Ancza Erzsébet
Institute of Mechanical Engineering and Technology, Óbuda University, 1034 Budapest, Hungary.
Institute for Natural Sciences and Basic Subjects, Óbuda University, 1034 Budapest, Hungary.
Materials (Basel). 2024 Jan 6;17(2):292. doi: 10.3390/ma17020292.
When describing the tribological behaviour of technical surfaces, the need for full-length scale microtopographic characterization often arises. The self-affine of surfaces and the characterisation of self-affine using a fractal dimension and its implantation into tribological models are commonly used. The goal of our present work was to determine the frequency range of fractal behaviour of surfaces by analysing the microtopographic measurements of an anodised aluminium brake plunger. We also wanted to know if bifractal and multifractal behaviour can be detected in real machine parts. As a result, we developed a new methodology for determining the fractal range boundaries to separate the nano- and micro-roughness. To reach our goals, we used an atomic force microscope (AFM) and a stylus instrument to obtain measurements in a wide frequency range (19 nm-3 mm). Power spectral density (PSD)-based fractal evaluation found that the examined surface could not be characterised by a single fractal dimension. A new method capable of separating nano- and micro-roughness has been developed for investigating multifractal behaviour. The presented procedure separates nano- and micro-roughness based on the geometric characteristics of surfaces. In this way, it becomes possible to specifically examine the relationship between the micro-geometry that can be measured in each wavelength range and the effects of cutting technology and the material structure that creates them.
在描述技术表面的摩擦学行为时,常常需要对整个长度尺度进行微观形貌表征。表面的自仿射性以及使用分形维数对自仿射性进行表征并将其应用于摩擦学模型是常用的方法。我们当前工作的目标是通过分析阳极氧化铝制动柱塞的微观形貌测量结果来确定表面分形行为的频率范围。我们还想知道在实际机器部件中是否能检测到双分形和多分形行为。结果,我们开发了一种确定分形范围边界以分离纳米粗糙度和微观粗糙度的新方法。为了实现我们的目标,我们使用原子力显微镜(AFM)和触针仪在宽频率范围(19纳米 - 3毫米)内获取测量结果。基于功率谱密度(PSD)的分形评估发现,所检查的表面不能用单一的分形维数来表征。已开发出一种能够分离纳米粗糙度和微观粗糙度的新方法来研究多分形行为。所提出的程序基于表面的几何特征分离纳米粗糙度和微观粗糙度。通过这种方式,就有可能专门研究在每个波长范围内可测量的微观几何形状与切削技术以及产生这些形状的材料结构之间的关系。