Oasi Research Institute-IRCCS, 94018 Troina, Italy.
Department Biological, Geological and Environmental Sciences, University of Catania, Via Androne 81, 95124 Catania, Italy.
Int J Mol Sci. 2024 Jan 17;25(2):1146. doi: 10.3390/ijms25021146.
Developmental and epileptic encephalopathies (DEE) are severe neurodevelopmental disorders characterized by recurrent, usually early-onset, epileptic seizures accompanied by developmental impairment often related to both underlying genetic etiology and abnormal epileptiform activity. Today, next-generation sequencing technologies (NGS) allow us to sequence large portions of DNA quickly and with low costs. The aim of this study is to evaluate the use of whole-exome sequencing (WES) as a first-line molecular genetic test in a sample of subjects with DEEs characterized by early-onset drug-resistant epilepsies, associated with global developmental delay and/or intellectual disability (ID). We performed 82 WESs, identifying 35 pathogenic variants with a detection rate of 43%. The identified variants were highlighted on 29 different genes including, 3 new candidate genes (, , ) for DEEs never identified before. In total, 23 out of 35 (66%) de novo variants were identified. The most frequently identified type of inheritance was autosomal dominant de novo (60%) followed by autosomal recessive in homozygosity (17%) and heterozygosity (11%), autosomal dominant inherited from parental mosaicism (6%) and X-linked dominant de novo (6%). The most frequent mutations identified were missense (75%) followed by frameshift deletions (16%), frameshift duplications (5%), and splicing mutations (3%). Considering the results obtained in the present study we support the use of WES as a form of first-line molecular genetic testing in DEEs.
发育性和癫痫性脑病(DEE)是严重的神经发育障碍,其特征是反复发生的癫痫发作,通常在早期发作,伴有发育障碍,通常与潜在的遗传病因和异常癫痫样活动有关。如今,下一代测序技术(NGS)使我们能够快速且低成本地对大片段 DNA 进行测序。本研究旨在评估全外显子组测序(WES)作为一线分子遗传学检测在一组以早期耐药性癫痫发作、伴有全面发育迟缓及/或智力障碍(ID)为特征的 DEE 患者中的应用。我们进行了 82 次 WES,鉴定出 35 种致病性变异,检出率为 43%。鉴定出的变异突出显示在 29 个不同的基因上,包括 3 个以前从未在 DEE 中发现的新候选基因(、、)。在总共 35 个(66%)新发变异中,有 23 个是新发变异。最常识别的遗传方式是常染色体显性新发(60%),其次是纯合子的常染色体隐性遗传(17%)和杂合子(11%)、来自父母镶嵌体的常染色体显性遗传(6%)和 X 连锁显性新发(6%)。最常见的突变类型是错义(75%),其次是移码缺失(16%)、移码重复(5%)和剪接突变(3%)。考虑到本研究的结果,我们支持在 DEE 中使用 WES 作为一线分子遗传学检测的形式。