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运算放大器对通过电源端口注入的传导电磁干扰的电磁敏感性分析。

Electromagnetic Susceptibility Analysis of the Operational Amplifier to Conducted EMI Injected through the Power Supply Port.

作者信息

Huang Peng, Li Bing, Wei Mengyuan, Hao Xuchun, Chen Xi, Huang Xiaozong, Huang Wei, Zhou Shuling, Wen Xiaokang, Xie Shuguo, Su Donglin

机构信息

School of Electronic and Information Engineering, Beihang University, Beijing 100191, China.

Research Institute for Frontier Science, Beihang University, Beijing 100191, China.

出版信息

Micromachines (Basel). 2024 Jan 11;15(1):121. doi: 10.3390/mi15010121.

DOI:10.3390/mi15010121
PMID:38258240
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC10818561/
Abstract

Operational amplifiers (op-amps) are widely used in circuit systems. The increasing complexity of the power supply network has led to the susceptibility of the power supply port to electromagnetic interference (EMI) in circuit systems. Therefore, it is necessary to investigate the electromagnetic susceptibility (EMS) of op-amps at the power supply port. In this paper, we assessed the effect of EMI on the operational performance of op-amps through the power supply port by a bulk current injection (BCI) method. Firstly, we conducted the continuous sine wave into the power supply port by a current injection probe and measured the change in the offset voltage under EMI. Secondly, we proposed a new method of conducted susceptibility and obtained the susceptibility threshold regularities of the op-amps at the power supply port under the interference of different waveform signals. Our study provided conclusive evidence that EMI reduced the reliability of the op-amp by affecting the offset voltage of op-amps and demonstrated that the sensitivity type of op-amps was peak-sensitive at the power supply port. This study contributed to a deep understanding of the EMS mechanism and guided the design of electromagnetic compatibility (EMC) of op-amps.

摘要

运算放大器（运放）在电路系统中被广泛使用。电源网络日益复杂，导致电路系统中电源端口易受电磁干扰（EMI）影响。因此，有必要研究运放在电源端口的电磁敏感度（EMS）。在本文中，我们通过大电流注入（BCI）方法评估了EMI通过电源端口对运放工作性能的影响。首先，我们通过电流注入探头向电源端口注入连续正弦波，并测量了EMI下失调电压的变化。其次，我们提出了一种传导敏感度的新方法，并获得了在不同波形信号干扰下运放在电源端口的敏感度阈值规律。我们的研究提供了确凿证据，证明EMI通过影响运放的失调电压降低了运放的可靠性，并表明运放在电源端口的敏感类型为峰值敏感型。本研究有助于深入理解EMS机制，并指导运放的电磁兼容性（EMC）设计。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/76e8bdfef4d3/micromachines-15-00121-g013.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/3dcfb5515956/micromachines-15-00121-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/3c340f49df34/micromachines-15-00121-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/5fde090d6def/micromachines-15-00121-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/711b7869320d/micromachines-15-00121-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/5c078fe37a7d/micromachines-15-00121-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/2e5c2f1926ff/micromachines-15-00121-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/4c488693f81b/micromachines-15-00121-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/143294f800d5/micromachines-15-00121-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/e6d1eb0d2404/micromachines-15-00121-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/a795c91a3460/micromachines-15-00121-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/75fddbdc6fe7/micromachines-15-00121-g011.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/21fce8bbc5cb/micromachines-15-00121-g012.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/76e8bdfef4d3/micromachines-15-00121-g013.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/3dcfb5515956/micromachines-15-00121-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/3c340f49df34/micromachines-15-00121-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/5fde090d6def/micromachines-15-00121-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/711b7869320d/micromachines-15-00121-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/5c078fe37a7d/micromachines-15-00121-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/2e5c2f1926ff/micromachines-15-00121-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/4c488693f81b/micromachines-15-00121-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/143294f800d5/micromachines-15-00121-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/e6d1eb0d2404/micromachines-15-00121-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/a795c91a3460/micromachines-15-00121-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/75fddbdc6fe7/micromachines-15-00121-g011.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/21fce8bbc5cb/micromachines-15-00121-g012.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/67fd/10818561/76e8bdfef4d3/micromachines-15-00121-g013.jpg

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