Lin Angyi, Sheng Pengju, Ning Shoucong, Zhang Fucai
Appl Opt. 2024 Jan 20;63(3):804-809. doi: 10.1364/AO.510143.
Accurate determination of scan positions is essential for achieving high-quality reconstructions in ptychographic imaging. This study presents and demonstrates a method for determining the rotation angle of the scan pattern relative to the detector pixel array using diffraction data. The method is based on the Fourier-Mellin transform and cross-correlation calculation. It can correct rotation errors up to 60 deg. High-quality reconstructions were obtained for visible light and electron microscopy datasets, and intricate structures of samples can be revealed. We believe that this refinement method for rotary position errors can be valuable for improving the performance of ptychographic four-dimensional scanning transmission electron microscopy.
准确确定扫描位置对于在叠层成像中实现高质量重建至关重要。本研究提出并演示了一种利用衍射数据确定扫描图案相对于探测器像素阵列旋转角度的方法。该方法基于傅里叶 - 梅林变换和互相关计算。它可以校正高达60度的旋转误差。对于可见光和电子显微镜数据集都获得了高质量的重建结果，并且可以揭示样品的精细结构。我们认为这种旋转位置误差的优化方法对于提高叠层四维扫描透射电子显微镜的性能可能具有重要价值。
