Fault diagnosis based on counterfactual inference for the batch fermentation process.

Fault diagnosis plays a pivotal role in identifying the root causes of a fault. Current fault diagnosis methods encounter the shortcomings being unable to assess the fault amplitude or having low efficiency for batch fermentation process. In order to solve the above problems, this paper proposes a fault detection model named convolutional neural network based on variational autoencoder (CNN-VAE) and a fault diagnosis based on counterfactual inference (FDCI). To begin with, quality-related process variables are selected using mutual information (MI). Next, a two-dimensional moving window is used to obtain input sequences from the process data. Then, two statistics from the latent and residual domains of the CNN-VAE model are constructed for fault detection. Additionally, once a fault occurs, FDCI is used to locate the root cause of a fault. Finally, a simulation process and a real-world L. plantarum batch fermentation process are provided to demonstrate the effectiveness of the proposed approache.