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氧空位和界面应变对VO纳米梁金属-绝缘体转变的影响。

Effects of oxygen vacancies and interfacial strain on the metal-insulator transition of VO nanobeams.

作者信息

Guo Xitao, Liu Xin, Zafar Zainab, Cheng Guiquan, Li Yunhai, Nan Haiyan, Lin Lianghua, Zou Jijun

机构信息

Jiangxi Engineering Province Engineering Research Center of New Energy Technology and Equipment, East China University of Technology, Nanchang 330013, China.

Experimental Physics Division, National Centre for Physics, Islamabad 44000, Pakistan.

出版信息

Phys Chem Chem Phys. 2024 Apr 3;26(14):10737-10745. doi: 10.1039/d3cp06040c.

Abstract

The role of oxygen vacancies and interfacial strain on the metal-insulator transition (MIT) behavior of high-quality VO nanobeams (NBs) synthesized on SiO/Si substrates employing VO as a precursor has been investigated in this research. Selective oxygen vacancies have been generated by argon plasma irradiation. The MIT is progressively suppressed as the duration of plasma processing increases; in addition, the temperature of MIT () drops by up to 95 K relative to the pristine VO NBs. Incorporating oxygen vacancies into VO may increase its electron concentration, which might shift the Fermi levels upward, strengthen the electronic orbital overlap of the V-V chains, and further stabilize the metallic phase at lower temperatures, based on first-principles calculations. Furthermore, in order to evaluate the influence of substrate-induced strain in our situation, the MIT in two distinct types of VO NB samples is examined without metal contacts by using the distinctive light scattering characteristics of the metal (M) and insulator (I) phases (, M/I domains) by optical microscopy. It is found that the domain structures in the "clamped" NBs persisted up to ∼453 K, while the "released" NBs (transferred to a new substrate) did not exhibit any domain structures and turned into an entirely M phase with a dark contrast above ∼348 K. When combined with first-principles calculations, the electronic orbital occupancy in the rutile phase contributes to explaining the interfacial strain-induced modulation of MIT. The current findings shed light on how interfacial strain and oxygen vacancies impact MIT behavior. It also suggests several types of control strategies for MIT in VO NBs, which are essential for a broader spectrum of VO NB applications.

摘要

本研究考察了以VO为前驱体在SiO/Si衬底上合成的高质量VO纳米梁(NBs)中氧空位和界面应变对金属-绝缘体转变(MIT)行为的作用。通过氩等离子体辐照产生了选择性氧空位。随着等离子体处理时间的增加,MIT逐渐受到抑制;此外,相对于原始VO纳米梁,MIT的温度()下降了高达95 K。基于第一性原理计算,将氧空位引入VO可能会增加其电子浓度,这可能会使费米能级向上移动,增强V-V链的电子轨道重叠,并在更低温度下进一步稳定金属相。此外,为了评估在我们的情况下衬底诱导应变的影响,通过光学显微镜利用金属(M)和绝缘体(I)相(,M/I畴)独特的光散射特性,在没有金属接触的情况下检查了两种不同类型的VO纳米梁样品中的MIT。发现“夹紧”纳米梁中的畴结构在高达约453 K时仍然存在,而“释放”的纳米梁(转移到新衬底上)没有表现出任何畴结构,并且在高于约348 K时变成了具有暗对比度的完全M相。当与第一性原理计算相结合时,金红石相中的电子轨道占据有助于解释界面应变诱导的MIT调制。当前的研究结果揭示了界面应变和氧空位如何影响MIT行为。它还提出了几种用于VO纳米梁中MIT的控制策略,这对于更广泛的VO纳米梁应用至关重要。

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