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用于消除通过材料挤出制造的生坯部件中固有孔隙的负压驱动软变形方法介绍。

Introduction to subpressure-driven soft deformation method for removing inherent voids in green components manufactured by material extrusion.

作者信息

Im Taehyeob, Oh Heungseok, Goh Byeonghwa, Kim Juyong, Lee Jai-Sung, Choi Joonmyung, Lee Caroline Sunyong

机构信息

Department of Materials and Chemical Engineering, Hanyang University ERICA, Republic of Korea.

Department of Mechanical Design and Engineering, Hanyang University, 222 Wangsimni-ro, Seongdong-gu, Seoul, 04763, Republic of Korea.

出版信息

Heliyon. 2024 Mar 28;10(7):e28689. doi: 10.1016/j.heliyon.2024.e28689. eCollection 2024 Apr 15.

Abstract

This study introduces a post-treatment process, the subpressure-driven soft deformation method, to reduce inherent voids in Material Extrusion (MEX) components. By subjecting printed green components to heat treatment under subpressure, the process enhances viscosity, effectively filling voids formed between deposited tracks. The average porosities of the samples sintered from the green components without and with soft deformation are calculated to be 3.55% and 2.36%, respectively. A comparison of the tensile strengths and fracture surfaces of the sintered samples with and without soft deformation treatment indicated that the sintered samples with soft deformation treatment exhibited narrower standard deviation for the various mechanical properties. Capillary rheometer calculations indicate feedstock viscosity to be between 450.34 and 1018.31 Pa s under subpressure, diminishing inter-track voids without sizeable dimensional changes. Molecular dynamics simulation demonstrates a 3.7-fold increase in bond strength, indicating intertrack voids effectively eliminated. Reduced inter-particle distances facilitate necking, grain growth, and improved sintered density.

摘要

本研究引入了一种后处理工艺——负压驱动软变形法,以减少材料挤出(MEX)部件中的固有孔隙。通过在负压下对打印的生坯部件进行热处理,该工艺提高了粘度,有效填充了沉积轨迹之间形成的孔隙。计算得出,未经软变形和经过软变形的生坯部件烧结后的样品平均孔隙率分别为3.55%和2.36%。对经过和未经过软变形处理的烧结样品的拉伸强度和断裂表面进行比较表明,经过软变形处理的烧结样品在各种机械性能方面表现出更窄的标准偏差。毛细管流变仪计算表明,在负压下原料粘度在450.34至1018.31 Pa·s之间,减少了轨迹间孔隙,且尺寸变化不大。分子动力学模拟表明键合强度提高了3.7倍,表明轨迹间孔隙得到有效消除。颗粒间距离的减小有利于颈缩、晶粒生长和烧结密度的提高。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/4a44/11002578/b3472847012f/ga1.jpg

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