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调制照明显微镜:在核纳米结构分析中的应用前景。

Modulated illumination microscopy: Application perspectives in nuclear nanostructure analysis.

作者信息

Cremer Christoph, Schock Florian, Failla Antonio Virgilio, Birk Udo

机构信息

Kirchhoff Institute for Physics (KIP), Heidelberg, Germany.

Interdisciplinary Centre for Scientific Computing (IWR), University of Heidelberg, Heidelberg, Germany.

出版信息

J Microsc. 2024 Nov;296(2):121-128. doi: 10.1111/jmi.13297. Epub 2024 Apr 15.

DOI:10.1111/jmi.13297
PMID:38618985
Abstract

The structure of the cell nucleus of higher organisms has become a major topic of advanced light microscopy. So far, a variety of methods have been applied, including confocal laser scanning fluorescence microscopy, 4Pi, STED and localisation microscopy approaches, as well as different types of patterned illumination microscopy, modulated either laterally (in the object plane) or axially (along the optical axis). Based on our experience, we discuss here some application perspectives of Modulated Illumination Microscopy (MIM) and its combination with single-molecule localisation microscopy (SMLM). For example, spatially modulated illumination microscopy/SMI (illumination modulation along the optical axis) has been used to determine the axial extension (size) of small, optically isolated fluorescent objects between ≤ 200 nm and ≥ 40 nm diameter with a precision down to the few nm range; it also allows the axial positioning of such structures down to the 1 nm scale; combined with laterally structured illumination/SIM, a 3D localisation precision of ≤1 nm is expected using fluorescence yields typical for SMLM applications. Together with the nanosizing capability of SMI, this can be used to analyse macromolecular nuclear complexes with a resolution approaching that of cryoelectron microscopy.

摘要

高等生物细胞核的结构已成为先进光学显微镜的一个主要研究课题。到目前为止,已经应用了多种方法,包括共聚焦激光扫描荧光显微镜、4Pi显微镜、受激发射损耗显微镜(STED)和定位显微镜方法,以及不同类型的图案照明显微镜,这些显微镜在横向(物平面内)或轴向(沿光轴)进行调制。基于我们的经验,我们在此讨论调制照明显微镜(MIM)及其与单分子定位显微镜(SMLM)结合的一些应用前景。例如,空间调制照明显微镜/SMI(沿光轴的照明调制)已被用于确定直径在≤200 nm至≥40 nm之间的小型光学隔离荧光物体的轴向延伸(尺寸),精度可达几纳米范围;它还能将此类结构的轴向定位精度降至1纳米尺度;与横向结构照明/SIM相结合,使用SMLM应用典型的荧光产率,预计三维定位精度≤1纳米。结合SMI的纳米尺寸测量能力,这可用于分析大分子核复合物,其分辨率接近冷冻电子显微镜。

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