Weber Jonathan T, Schäfer Sascha
Institute of Physics, Carl-von-Ossietzky University of Oldenburg, 26129 Oldenburg, Germany.
Department of Physics, University of Regensburg, 93053 Regensburg, Germany.
Nano Lett. 2024 May 15;24(19):5746-5753. doi: 10.1021/acs.nanolett.4c00773. Epub 2024 May 3.
Surface charging is ubiquitously observable during in situ transmission electron microscopy of nonconducting specimens as a result of electron beam/sample interactions or optical stimuli and often limits the achievable image stability and spatial or spectral resolution. Here, we report on the electron-optical imaging of surface charging on a nanostructured surface following femtosecond multiphoton photoemission. By quantitatively extracting the light-induced electrostatic potential and studying the charging dynamics on relevant time scales, we gain insights into the details of the multiphoton photoemission process in the presence of an electrostatic background field. We study the interaction of the charge distribution with the high-energy electron beam and secondary electrons and propose a simple model to describe the interplay of electron- and light-induced processes. In addition, we demonstrate how to mitigate sample charging by simultaneously optically illuminating the sample.
在对非导电样品进行原位透射电子显微镜观察时,由于电子束与样品的相互作用或光学刺激,表面充电现象普遍可见,这常常限制了可实现的图像稳定性以及空间或光谱分辨率。在此,我们报告了飞秒多光子光发射后纳米结构表面上表面充电的电子光学成像。通过定量提取光诱导的静电势并研究相关时间尺度上的充电动力学,我们深入了解了在静电背景场存在下多光子光发射过程的细节。我们研究了电荷分布与高能电子束和二次电子的相互作用,并提出了一个简单模型来描述电子诱导和光诱导过程的相互作用。此外,我们展示了如何通过同时对样品进行光学照明来减轻样品充电。