Ip Chi Ian Jess, Gao Qiang, Nguyen Khanh Duy, Yan Chenhui, Yan Gangbin, Hoenig Eli, Marchese Thomas S, Zhang Minghao, Lee Woojoo, Rokni Hossein, Meng Ying Shirley, Liu Chong, Yang Shuolong
Pritzker School of Molecular Engineering, University of Chicago, Chicago, Illinois 60637, United States.
Department of NanoEngineering, University of California San Diego, La Jolla, California 92093, United States.
Nano Lett. 2024 Jun 26;24(25):7557-7563. doi: 10.1021/acs.nanolett.4c00008. Epub 2024 May 17.
Ultrathin topological insulator membranes are building blocks of exotic quantum matter. However, traditional epitaxy of these materials does not facilitate stacking in arbitrary orders, while mechanical exfoliation from bulk crystals is also challenging due to the non-negligible interlayer coupling therein. Here we liberate millimeter-scale films of the topological insulator BiSe, grown by molecular beam epitaxy, down to 3 quintuple layers. We characterize the preservation of the topological surface states and quantum well states in transferred BiSe films using angle-resolved photoemission spectroscopy. Leveraging the photon-energy-dependent surface sensitivity, the photoemission spectra taken with 6 and 21.2 eV photons reveal a transfer-induced migration of the topological surface states from the top to the inner layers. By establishing clear electronic structures of the transferred films and unveiling the wave function relocation of the topological surface states, our work lays the physics foundation crucial for the future fabrication of artificially stacked topological materials with single-layer precision.
超薄拓扑绝缘体薄膜是奇异量子物质的基本组成部分。然而,这些材料的传统外延生长方法不利于以任意顺序堆叠,而从块状晶体进行机械剥离也具有挑战性,因为其中的层间耦合不可忽略。在此,我们将通过分子束外延生长的毫米级拓扑绝缘体BiSe薄膜减薄至3个五重层。我们使用角分辨光电子能谱表征了转移后的BiSe薄膜中拓扑表面态和量子阱态的保留情况。利用光子能量依赖的表面灵敏度,用6 eV和21.2 eV光子拍摄的光电子能谱揭示了拓扑表面态从顶层到内层的转移诱导迁移。通过建立转移薄膜清晰的电子结构并揭示拓扑表面态的波函数重新定位,我们的工作为未来以单层精度人工堆叠拓扑材料的制造奠定了关键的物理基础。