Tang Ruizhi, Goethals Wannes, Organista Caori, Van Hoorebeke Luc, Stampanoni Marco, Aelterman Jan, Boone Matthieu N
Opt Express. 2024 Apr 8;32(8):14607-14619. doi: 10.1364/OE.518821.
X-ray dual-phase grating interferometry provides quantitative micro-structural information beyond the optical resolution through its tunable correlation length. Ensuring optimal performance of the set-up requires accurate correlation length estimation and precise alignment of the gratings. This paper presents an automated procedure for determining the complete geometrical parameters of the interferometer set-up with a high degree of precision. The algorithm's effectiveness is then evaluated through a series of experimental tests, illustrating its accuracy and robustness.
X射线双相光栅干涉测量法通过其可调相关长度提供超越光学分辨率的定量微观结构信息。确保该装置的最佳性能需要精确估计相关长度并精确对准光栅。本文提出了一种自动程序,用于高精度地确定干涉仪装置的完整几何参数。然后通过一系列实验测试评估该算法的有效性,展示其准确性和稳健性。