Soubies Emmanuel, Nogueron Alejandro, Pelletier Florence, Mangeat Thomas, Leterrier Christophe, Unser Michael, Sage Daniel
IRIT, Université de Toulouse, CNRS, Toulouse, France.
Biomedical Imaging Group, EPFL, Lausanne, Switzerland.
J Microsc. 2024 Oct;296(1):94-106. doi: 10.1111/jmi.13344. Epub 2024 Jul 16.
Super-resolution structured-illumination microscopy (SIM) is a powerful technique that allows one to surpass the diffraction limit by up to a factor two. Yet, its practical use is hampered by its sensitivity to imaging conditions which makes it prone to reconstruction artefacts. In this work, we present FlexSIM, a flexible SIM reconstruction method capable to handle highly challenging data. Specifically, we demonstrate the ability of FlexSIM to deal with the distortion of patterns, the high level of noise encountered in live imaging, as well as out-of-focus fluorescence. Moreover, we show that FlexSIM achieves state-of-the-art performance over a variety of open SIM datasets.
超分辨率结构光照明显微镜（SIM）是一种强大的技术，它能够让人突破衍射极限，分辨率提高至两倍。然而，其实际应用受到成像条件的限制，容易产生重建伪像。在这项工作中，我们提出了FlexSIM，这是一种灵活的SIM重建方法，能够处理极具挑战性的数据。具体而言，我们展示了FlexSIM处理图案失真、活细胞成像中遇到的高水平噪声以及离焦荧光的能力。此外，我们表明FlexSIM在各种开放的SIM数据集上都达到了当前的最佳性能。
