X-ray Computed Tomography Data of Additive Manufacturing Metrology Testbed (AMMT) Parts: "Overhang Part X4".
作者信息
Praniewicz Max, Lane Brandon, Kim Felix, Saldana Christopher
机构信息
Georgia Institute of Technology, Atlanta, GA 30332, USA.
National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
出版信息
J Res Natl Inst Stand Technol. 2020 Oct 1;125:125031. doi: 10.6028/jres.125.031. eCollection 2020.
Abstract
摘要
Zotero 插件