Zhang Linlong, Kuang Yazhuo, Ye Gang, Liu Jian
State Key Laboratory of Polymer Physics and Chemistry & Key Laboratory of Polymer Science and Technology, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, P.R. China.
School of Applied Chemistry and Engineering, University of Science and Technology of China, Hefei 230026, P. R. China.
ACS Appl Mater Interfaces. 2024 Jul 31;16(30):39693-39700. doi: 10.1021/acsami.4c04917. Epub 2024 Jul 22.
Conjugated polymers with ethylene glycol-type side chains are commonly used as channel materials in organic electrochemical transistors (OECTs). To improve the performance of these materials, new chemical structures are often created through synthetic routines. Herein, we demonstrate that the OECT performance of these polymers can also be improved by changing their density-of-state (DOS) profile through solvent engineering. Depending on the solvent polarity, it solvates the backbone and side chains of the conjugated polymer differently, leading to differences in molecule orientation, π-stacking paracrystallinity, and film defects, such as grain boundaries and pinholes. This then results in a change in the DOS profile of the polymer. A more intense and narrow-width DOS distribution is usually observed in organic films with an "edge on" orientation and fewer film defects, while films with a "face on" orientation and apparent defects show a broadened DOS profile. The OECT devices that use the polymer film with a more intense and narrow-width DOS profile exhibit a better-normalized transconductance and figure-of-merit than those with a broadened DOS profile (0.74 to 4.29 S cm and 3.5 to 14.3 F cm V s). This study provides useful insights into how the DOS profile affects the mixed ionic-electronic conduction performance and presents a new avenue for improving n-type OECT materials.
带有乙二醇型侧链的共轭聚合物通常被用作有机电化学晶体管(OECT)中的沟道材料。为了提高这些材料的性能,人们常常通过合成方法创造新的化学结构。在此,我们证明这些聚合物的OECT性能也可以通过溶剂工程改变其态密度(DOS)分布来提高。根据溶剂极性的不同,它对共轭聚合物的主链和侧链的溶剂化作用也不同,从而导致分子取向、π-堆积准晶度以及薄膜缺陷(如晶界和针孔)的差异。这进而导致聚合物DOS分布的变化。在具有“边缘取向”且薄膜缺陷较少的有机薄膜中,通常会观察到更强烈且宽度更窄的DOS分布,而具有“面取向”且存在明显缺陷的薄膜则呈现出变宽的DOS分布。与具有变宽DOS分布的OECT器件相比,使用具有更强烈且宽度更窄DOS分布的聚合物薄膜的OECT器件表现出更好的归一化跨导和品质因数(0.74至4.29 S cm和3.5至14.3 F cm V s)。这项研究为DOS分布如何影响混合离子 - 电子传导性能提供了有用的见解,并为改进n型OECT材料开辟了一条新途径。