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用于测量高迁移率WSe₂中关联态的电荷转移接触

Charge-transfer contacts for the measurement of correlated states in high-mobility WSe.

作者信息

Pack Jordan, Guo Yinjie, Liu Ziyu, Jessen Bjarke S, Holtzman Luke, Liu Song, Cothrine Matthew, Watanabe Kenji, Taniguchi Takashi, Mandrus David G, Barmak Katayun, Hone James, Dean Cory R

机构信息

Department of Physics, Columbia University, New York, NY, USA.

Department of Applied Physics and Applied Mathematics, Columbia University, New York, NY, US.

出版信息

Nat Nanotechnol. 2024 Jul;19(7):948-954. doi: 10.1038/s41565-024-01702-5. Epub 2024 Jul 25.

Abstract

Two-dimensional semiconductors, such as transition metal dichalcogenides, have demonstrated tremendous promise for the development of highly tunable quantum devices. Realizing this potential requires low-resistance electrical contacts that perform well at low temperatures and low densities where quantum properties are relevant. Here we present a new device architecture for two-dimensional semiconductors that utilizes a charge-transfer layer to achieve large hole doping in the contact region, and implement this technique to measure the magnetotransport properties of high-purity monolayer WSe. We measure a record-high hole mobility of 80,000 cm V s and access channel carrier densities as low as 1.6 × 10 cm, an order of magnitude lower than previously achievable. Our ability to realize transparent contact to high-mobility devices at low density enables transport measurements of correlation-driven quantum phases including the observation of a low-temperature metal-insulator transition in a density and temperature regime where Wigner crystal formation is expected and the observation of the fractional quantum Hall effect under large magnetic fields. The charge-transfer contact scheme enables the discovery and manipulation of new quantum phenomena in two-dimensional semiconductors and their heterostructures.

摘要

二维半导体,如过渡金属二硫属化物,已展现出在高度可调谐量子器件开发方面的巨大潜力。要实现这一潜力,需要低电阻电接触,这种接触在与量子特性相关的低温和低密度条件下性能良好。在此,我们展示了一种用于二维半导体的新型器件架构,该架构利用电荷转移层在接触区域实现大空穴掺杂,并运用此技术测量高纯度单层WSe₂的磁输运特性。我们测得创纪录的高空穴迁移率80,000 cm² V⁻¹ s⁻¹,且可实现低至1.6×10¹¹ cm⁻²的沟道载流子密度,比之前所能达到的低一个数量级。我们在低密度下实现与高迁移率器件的透明接触的能力,使得能够对关联驱动的量子相进行输运测量,包括在预期会形成维格纳晶体的密度和温度区域观察到低温金属 - 绝缘体转变,以及在强磁场下观察到分数量子霍尔效应。电荷转移接触方案能够发现和操控二维半导体及其异质结构中的新量子现象。

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