Seriani Nicola, Delcompare-Rodriguez Paola, Pandey Dhanshree, Adak Abhishek Kumar, Mahamiya Vikram, Pinilla Carlos, El-Khozondar Hala J
The Abdus Salam International Centre for Theoretical Physics, Strada Costiera 11, 34151 Trieste, Italy.
Istituto Officina dei Materiali, Consiglio Nazionale delle Ricerche (CNR-IOM), Via Bonomea 265, 34136 Trieste, Italy.
Materials (Basel). 2024 Jul 12;17(14):3460. doi: 10.3390/ma17143460.
In this paper, the effect of doping and nanostructuring on the electrostatic potential across the electrochemical interface between a transition metal oxide and a water electrolyte is investigated by means of the Poisson-Boltzmann model. For spherical nanoparticles and nanorods, compact expressions for the limiting potentials at which the space charge layer includes the whole semiconductor are reported. We provide a quantitative analysis of the distribution of the potential drop between the solid and the liquid and show that the relative importance changes with doping. It is usually assumed that high doping improves charge dynamics in the semiconductor but reduces the width of the space charge layer. However, nanostructuring counterbalances the latter negative effect; we show quantitatively that in highly doped nanoparticles the space charge layer can occupy a similar volume fraction as in low-doped microparticles. Moreover, as shown by some recent experiments, under conditions of high doping the electric fields in the Helmholtz layer can be as high as 100 mV/Å, comparable to electric fields inducing freezing in water. This work provides a systematic quantitative framework for understanding the effects of doping and nanostructuring on electrochemical interfaces, and suggests that it is necessary to better characterize the interface at the atomistic level.
在本文中,借助泊松-玻尔兹曼模型研究了掺杂和纳米结构化对过渡金属氧化物与水电解质之间电化学界面上静电势的影响。对于球形纳米颗粒和纳米棒,报道了空间电荷层包含整个半导体时极限电势的简洁表达式。我们对固体和液体之间电势降的分布进行了定量分析,并表明其相对重要性随掺杂而变化。通常认为高掺杂可改善半导体中的电荷动力学,但会减小空间电荷层的宽度。然而,纳米结构化可抵消后一种负面影响;我们定量表明,在高掺杂纳米颗粒中,空间电荷层所占的体积分数可与低掺杂微粒中的相似。此外,正如最近一些实验所示,在高掺杂条件下,亥姆霍兹层中的电场可高达100 mV/Å,与使水冻结的电场相当。这项工作为理解掺杂和纳米结构化对电化学界面的影响提供了一个系统的定量框架,并表明有必要在原子水平上更好地表征界面。