• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

溶液法制备的具有强剩余普克尔系数的Pb(Zr,Ti)O薄膜

Solution-Processed Pb(Zr,Ti)O Thin Films with Strong Remnant Pockels Coefficient.

作者信息

Picavet Ewout, De Geest Kobe, Lievens Enes, Rijckaert Hannes, Vandekerckhove Tom, Solano Eduardo, Deduytsche Davy, Van Bossele Laura, Van Thourhout Dries, De Buysser Klaartje, Beeckman Jeroen

机构信息

SCRiPTS, Department of Chemistry, Ghent University, Krijgslaan 281-S3, 9000 Ghent, Belgium.

LCP Group, Department of Electronics and Information Systems, Ghent University, Technologiepark - Zwijnaarde 126, 9052 Gent, Belgium.

出版信息

ACS Appl Mater Interfaces. 2024 Aug 7;16(31):41134-41144. doi: 10.1021/acsami.4c07073. Epub 2024 Jul 30.

DOI:10.1021/acsami.4c07073
PMID:39077874
Abstract

In contrast to the widely studied electrical properties of Pb(Zr,Ti)O thin films, which have led to their applicability in various application areas such as thin film capacitors, microelectronics, and ferroelectric memories, the electro-optic (EO) properties are far less studied, which hinders the applicability of Pb(Zr,Ti)O films for EO applications such as heterogeneously integrated phase modulators in silicon (Si) photonics. Therefore, the EO properties of Pb(Zr,Ti)O films need to be further investigated to pave the way for the applicability of Pb(Zr,Ti)O films in EO applications. As the EO properties of ferroelectric thin films strongly depend on their crystal phase and texture, which in turn are influenced by the method of film fabrication. Therefore, in this work, we investigate the EO properties of a promising solution process using a LaOCO template film. We successively characterize the precursor ink, microstructure and EO properties of the solution-processed Pb(Zr,Ti)Ofilm. The Pb(Zr,Ti)O film exhibits a fiber texture and has a large maximum and remnant Pockels coefficient () of 69 pm V and 66 pm V, respectively. The integration into a ring resonator-based modulator shows a VL of 2.019 V cm. The determination of these promising EO properties could further pave the way for the applicability of Pb(Zr,Ti)O thin films in Si photonics.

摘要

与对Pb(Zr,Ti)O薄膜广泛研究的电学性质不同,其电学性质已使其适用于诸如薄膜电容器、微电子学和铁电存储器等各种应用领域,而其电光(EO)性质的研究则少得多,这阻碍了Pb(Zr,Ti)O薄膜在诸如硅(Si)光子学中的异质集成相位调制器等电光应用中的适用性。因此,需要进一步研究Pb(Zr,Ti)O薄膜的电光性质,为其在电光应用中的适用性铺平道路。由于铁电薄膜的电光性质强烈依赖于其晶相和织构,而晶相和织构又受薄膜制备方法的影响。因此,在这项工作中,我们研究了使用LaOCO模板薄膜的一种有前景的溶液法的电光性质。我们依次表征了溶液法制备的Pb(Zr,Ti)O薄膜的前驱体墨水、微观结构和电光性质。该Pb(Zr,Ti)O薄膜呈现纤维织构,其最大和剩余普克尔系数()分别高达69 pm V和66 pm V。将其集成到基于环形谐振器的调制器中显示出2.019 V cm的半波电压。确定这些有前景的电光性质可为Pb(Zr,Ti)O薄膜在硅光子学中的适用性进一步铺平道路。

相似文献

1
Solution-Processed Pb(Zr,Ti)O Thin Films with Strong Remnant Pockels Coefficient.溶液法制备的具有强剩余普克尔系数的Pb(Zr,Ti)O薄膜
ACS Appl Mater Interfaces. 2024 Aug 7;16(31):41134-41144. doi: 10.1021/acsami.4c07073. Epub 2024 Jul 30.
2
Dielectric and Ferroelectric Performance of Pb(Zr(x)Ti(1-x))O3 Thin Films with Compositional Gradients.具有成分梯度的Pb(Zr(x)Ti(1 - x))O3薄膜的介电和铁电性能
J Nanosci Nanotechnol. 2015 Sep;15(9):7099-103. doi: 10.1166/jnn.2015.10548.
3
Novel Route for Enhancing Piezoelectricity of Ferroelectric Films: Controlling Nontrivial Polarization States in Pb(Zr, Ti)O Monodomain Superlattice Structure.增强铁电薄膜压电性的新途径:控制Pb(Zr,Ti)O单畴超晶格结构中的非平凡极化状态
ACS Appl Mater Interfaces. 2024 Apr 3;16(13):16145-16151. doi: 10.1021/acsami.3c18721. Epub 2024 Mar 22.
4
Lanthanide-Assisted Deposition of Strongly Electro-optic PZT Thin Films on Silicon: Toward Integrated Active Nanophotonic Devices.镧系元素辅助在硅上沉积强电光PZT薄膜:迈向集成有源纳米光子器件
ACS Appl Mater Interfaces. 2015 Jun 24;7(24):13350-9. doi: 10.1021/acsami.5b01781. Epub 2015 Jun 12.
5
Integrating Epitaxial-Like Pb(Zr,Ti)O3 Thin-Film into Silicon for Next-Generation Ferroelectric Field-Effect Transistor.将类外延Pb(Zr,Ti)O3薄膜集成到硅中用于下一代铁电场效应晶体管。
Sci Rep. 2016 Mar 23;6:23189. doi: 10.1038/srep23189.
6
Fabrication of 3-dimensional PbZr(1-x)Ti(x)O3 nanoscale thin film capacitors for high density ferroelectric random access memory devices.用于高密度铁电随机存取存储器器件的三维PbZr(1-x)Ti(x)O3纳米级薄膜电容器的制造
J Nanosci Nanotechnol. 2006 Nov;6(11):3333-7. doi: 10.1166/jnn.2006.004.
7
Large remanent polarization and small leakage in sol-gel derived Bi(Zn(1/2)Zr(1/2))O3-PbTiO3 ferroelectric thin films.溶胶-凝胶法制备的 Bi(Zn(1/2)Zr(1/2))O3-PbTiO3 铁电薄膜具有大剩余极化和小漏电流。
Dalton Trans. 2013 Jan 14;42(2):585-90. doi: 10.1039/c2dt31996a. Epub 2012 Nov 23.
8
Microstructure and ferroelectricity of BaTiO thin films on Si for integrated photonics.用于集成光子学的硅基钛酸钡薄膜的微结构和铁电性。
Nanotechnology. 2017 Feb 17;28(7):075706. doi: 10.1088/1361-6528/aa53c2. Epub 2016 Dec 14.
9
Lead-Free Perovskite Thin Films with Tailored Pockels-Kerr Effects for Photonics.用于光子学的具有定制泡克尔斯 - 克尔效应的无铅钙钛矿薄膜。
ACS Appl Mater Interfaces. 2023 Aug 9;15(31):38039-38048. doi: 10.1021/acsami.3c06499. Epub 2023 Jul 27.
10
Enhanced Ferroelectric and Piezoelectric Properties in Graphene-Electroded Pb(Zr,Ti)O Thin Films.石墨烯电极化的Pb(Zr,Ti)O薄膜中增强的铁电和压电性能
ACS Appl Mater Interfaces. 2022 Apr 20;14(15):17987-17994. doi: 10.1021/acsami.2c02277. Epub 2022 Apr 5.

引用本文的文献

1
A Pathway for the Integration of Novel Ferroelectric Thin Films on Non-Planar Photonic Integrated Circuits.一种在非平面光子集成电路上集成新型铁电薄膜的途径。
Micromachines (Basel). 2025 Mar 13;16(3):334. doi: 10.3390/mi16030334.
2
Measuring the Effective Electro-Optic Coefficient of Low-Temperature-Prepared Lead Zirconate Titanate Thin Films.测量低温制备的锆钛酸铅薄膜的有效电光系数
Materials (Basel). 2025 Feb 14;18(4):837. doi: 10.3390/ma18040837.