Hülagü Deniz, Tobias Charlie, Dao Radek, Komarov Pavel, Rurack Knut, Hodoroaba Vasile-Dan
Division 6.1 Surface and Thin Film Analysis, Federal Institute for Materials Research and Testing (BAM), Unter den Eichen 44-46, 12203, Berlin, Germany.
Division 1.9 Chemical and Optical Sensing, Federal Institute for Materials Research and Testing (BAM), Richard-Willstätter-Straße 11, 12489, Berlin, Germany.
Sci Rep. 2024 Aug 2;14(1):17936. doi: 10.1038/s41598-024-68797-7.
Recently, we have developed an algorithm to quantitatively evaluate the roughness of spherical microparticles using scanning electron microscopy (SEM) images. The algorithm calculates the root-mean-squared profile roughness (RMS-R) of a single particle by analyzing the particle's boundary. The information extracted from a single SEM image yields however only two-dimensional (2D) profile roughness data from the horizontal plane of a particle. The present study offers a practical procedure and the necessary software tools to gain quasi three-dimensional (3D) information from 2D particle contours recorded at different particle inclinations by tilting the sample (stage). This new approach was tested on a set of polystyrene core-iron oxide shell-silica shell particles as few micrometer-sized beads with different (tailored) surface roughness, providing the proof of principle that validates the applicability of the proposed method. SEM images of these particles were analyzed by the latest version of the developed algorithm, which allows to determine the analysis of particles in terms of roughness both within a batch and across the batches as a routine quality control procedure. A separate set of particles has been analyzed by atomic force microscopy (AFM) as a powerful complementary surface analysis technique integrated into SEM, and the roughness results have been compared.
最近,我们开发了一种算法,用于使用扫描电子显微镜(SEM)图像对球形微粒的粗糙度进行定量评估。该算法通过分析微粒的边界来计算单个微粒的均方根轮廓粗糙度(RMS-R)。然而,从单个SEM图像中提取的信息仅产生来自微粒水平面的二维(2D)轮廓粗糙度数据。本研究提供了一种实用的程序和必要的软件工具,通过倾斜样品(载物台),从在不同微粒倾斜度下记录的2D微粒轮廓中获取准三维(3D)信息。这种新方法在一组聚苯乙烯核-氧化铁壳-二氧化硅壳微粒(作为具有不同(定制)表面粗糙度的几微米大小的珠子)上进行了测试,提供了原理证明,验证了所提出方法的适用性。这些微粒的SEM图像由最新版本的已开发算法进行分析,该算法允许作为常规质量控制程序,在批次内和跨批次对微粒的粗糙度进行分析。另外一组微粒已通过原子力显微镜(AFM)进行分析,AFM是一种集成到SEM中的强大补充表面分析技术,并且已对粗糙度结果进行了比较。