Liu Bowen, Cheng Jialuo, Zhao Maoxiong, Yao Jin, Liu Xiaoyuan, Chen Shaohu, Shi Lei, Tsai Din Ping, Geng Zihan, Chen Mu Ku
State Key Laboratory of Surface Physics, Key Laboratory of Micro- and Nano-Photonic Structures (Ministry of Education) and Department of Physics, Fudan University, 200433, Shanghai, China.
Department of Electrical Engineering, City University of Hong Kong, Kowloon, Hong Kong SAR, China.
Light Sci Appl. 2024 Aug 6;13(1):182. doi: 10.1038/s41377-024-01530-1.
Metalens, characterized by their unique functions and distinctive physical properties, have gained significant attention for their potential applications. To further optimize the performance of metalens, it is necessary to characterize the phase modulation of the metalens. In this study, we present a multi-distance phase retrieval system based on optical field scanning and discuss its convergence and robustness. Our findings indicate that the system is capable of retrieving the phase distribution of the metalens as long as the measurement noise is low and the total length of the scanned light field is sufficiently long. This system enables the analysis of focal length and aberration by utilizing the computed phase distribution. We extend our investigation to measure the phase distribution of the metalens operating in the near-infrared (NIR) spectrum and identify the impact of defects in the sample on the phase. Additionally, we conduct a comparative analysis of the phase distribution of the metalens in air and ethanol and observe the variations in the phase modulation of the metalens in different working mediums. Our system provides a straightforward method for the phase characterization of metalens, aiding in optimizing the metalens design and functionality.
超表面因其独特的功能和鲜明的物理特性而备受关注,具有潜在的应用价值。为了进一步优化超表面的性能,有必要对超表面的相位调制进行表征。在本研究中,我们提出了一种基于光场扫描的多距离相位检索系统,并讨论了其收敛性和鲁棒性。我们的研究结果表明,只要测量噪声较低且扫描光场的总长度足够长,该系统就能检索超表面的相位分布。该系统能够利用计算出的相位分布来分析焦距和像差。我们进一步展开研究,测量了在近红外(NIR)光谱中工作的超表面的相位分布,并确定了样品中的缺陷对相位的影响。此外,我们对超表面在空气和乙醇中的相位分布进行了对比分析,观察了超表面在不同工作介质中相位调制的变化情况。我们的系统为超表面的相位表征提供了一种简单的方法,有助于优化超表面的设计和功能。