Zheng Zhihao, Own Christopher S, Wanner Adrian A, Koene Randal A, Hammerschmith Eric W, Silversmith William M, Kemnitz Nico, Lu Ran, Tank David W, Seung H Sebastian
Princeton Neuroscience Institute, Princeton University, Princeton, NJ, USA.
Voxa, Seattle, WA, USA.
Nat Commun. 2024 Aug 10;15(1):6860. doi: 10.1038/s41467-024-50846-4.
Serial section transmission electron microscopy (TEM) has proven to be one of the leading methods for millimeter-scale 3D imaging of brain tissues at nanoscale resolution. It is important to further improve imaging efficiency to acquire larger and more brain volumes. We report here a threefold increase in the speed of TEM by using a beam deflecting mechanism to enable highly efficient acquisition of multiple image tiles (nine) for each motion of the mechanical stage. For millimeter-scale areas, the duty cycle of imaging doubles to more than 30%, yielding a net average imaging rate of 0.3 gigapixels per second. If fully utilized, an array of four beam deflection TEMs should be capable of imaging a dataset of cubic millimeter scale in five weeks.
连续切片透射电子显微镜（TEM）已被证明是在纳米级分辨率下对脑组织进行毫米级三维成像的主要方法之一。进一步提高成像效率以获取更大、更多的脑容量非常重要。我们在此报告，通过使用光束偏转机制，TEM的速度提高了三倍，从而能够在机械载物台每次移动时高效采集多个图像块（九个）。对于毫米级区域，成像占空比翻倍至超过30%，产生的净平均成像速率为每秒0.3千兆像素。如果充分利用，由四台光束偏转TEM组成的阵列应该能够在五周内对立方毫米规模的数据集进行成像。
